K
K. Usharani
Researcher at A.V.V.M Sri Pushpam College
Publications - 15
Citations - 363
K. Usharani is an academic researcher from A.V.V.M Sri Pushpam College. The author has contributed to research in topics: Thin film & Doping. The author has an hindex of 10, co-authored 13 publications receiving 284 citations.
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Characteristic analysis on the physical properties of nanostructured Mg-doped CdO thin films—Doping concentration effect
TL;DR: In this article, the effect of Mg doping on the structural, morphological, optical and electrical properties of CdO thin films has been studied, and it was shown that the film morphology modifies from spherical shaped grains to closely packed cauliflower-shaped nanostructures with mg doping.
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Effect of doping concentration on the structural, morphological, optical and electrical properties of Mn-doped CdO thin films
TL;DR: In this paper, the influence of Mn incorporation on the structural, morphological, optical and electrical properties of thin films of manganese-doped cadmium oxide (CdO:Mn) was studied.
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Role of substrate temperature on the growth mechanism and physical properties of spray deposited lead oxide thin films
TL;DR: In this article, the effect of substrate temperature on the growth mechanism and physical properties of polycrystalline lead oxide films was investigated and the band gap value was found to be in the range of 2.3 to 2.62 eV.
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Properties of spray deposited Zn, Mg incorporated CdO thin films
K. Usharani,A. R. Balu +1 more
TL;DR: In this article, the effect of Zn, Mg incorporation on the structural, morphological, optical and electrical properties of the CdO films were investigated using X-ray diffraction (XRD), scanning electron microscopy, UV-Vis spectroscopy and dc electrical measurements respectively.
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Structural, morphological, optical and electrical properties of CdS thin films simultaneously doped with magnesium and chlorine
TL;DR: In this paper, the effect of Mg and Cl doping concentration on the structural, morphological, optical and electrical properties of the deposited films were investigated using X-ray diffraction (XRD), scanning electron microscopy, UV-Vis spectroscopy and dc electrical measurements, respectively.