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Karthyek Murthy

Researcher at Singapore University of Technology and Design

Publications -  33
Citations -  1010

Karthyek Murthy is an academic researcher from Singapore University of Technology and Design. The author has contributed to research in topics: Robust optimization & Estimator. The author has an hindex of 10, co-authored 33 publications receiving 670 citations. Previous affiliations of Karthyek Murthy include Columbia University & Tata Institute of Fundamental Research.

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Robust Wasserstein Profile Inference and Applications to Machine Learning

TL;DR: In this article, the authors show that several machine learning estimators, including square-root LASSO (Least Absolute Shrinkage and Selection) and regularized logistic regression can be represented as solutions to distributionally robust optimization problems.
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Quantifying Distributional Model Risk via Optimal Transport

TL;DR: In this paper, the problem of quantifying the impact of model misspecification when computing general expected values of interest is addressed, and a methodology that is applicable in great gene sequencing is proposed.
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Quantifying Distributional Model Risk via Optimal Transport

TL;DR: In this paper, the problem of quantifying the impact of model misspecification when computing general expected values of interest is addressed, and bounds for the expectation of interest regardless of the probability measure used, as long as the measure lies within a prescribed tolerance measured in terms of a flexible class of distances from a suitable baseline model.
Journal ArticleDOI

Robust Wasserstein Profile Inference and Applications to Machine Learning

TL;DR: Wasserstein Profile Inference is introduced, a novel inference methodology which extends the use of methods inspired by Empirical Likelihood to the setting of optimal transport costs (of which Wasserstein distances are a particular case).
Journal ArticleDOI

Quantifying Distributional Model Risk Via Optimal Transport

TL;DR: The approach consists in computing bounds for the expectation of interest regardless of the probability measure used, as long as the measure lies within a prescribed tolerance measured within a flexible class of distances from a suitable baseline model.