This invention relates to the use of thick target materials 50 microns and thicker for an x-ray transmission tube; to possible target material compositions including various elements and their alloys, eutectic alloys, compounds, or intermetallic compounds; and applications for utilizing such thick target transmission x-ray tubes. The target comprises at lease one portion of the target with a thickness of 50 microns or greater. The target can be optionally attached to a substrate end-window essentially transparent to x-rays or be thick enough so that no such substrate is required. Applications include producing a high percentage of monochromatic line mission x-rays of said thick target for use in reduced dose medical imaging and other non-destructive testing applications.

Thick targets for transmission x-ray tubes

A quantitative measuring method and apparatus of a metal phase contained in a plated layer using an X-ray diffraction method, and a method for making a plated steel sheet using them. The measuring precision can be improved to find an application to an on-line measurement by increasing the intensity of an X-ray diffracted from the metal phase contained in the plated layer. The diffracted X-ray from the metal phase is measured either over a predetermined range or at a plurality of positions on the Debye ring to increase the intensity of the diffracted X-ray thereby to improve the measurement precision. Moreover, the X-ray beam emitted from an X-ray source is compressed or made monochromatic or parallel to increase the intensity of the diffracted X-ray thereby to improve the measurement precision. The method and apparatus are utilized especially for measuring the alloying degree of a molten zinc plating.

Quantitative measuring method and apparatus of metal phase using x-ray diffraction method, and method for making plated steel sheet using them

In order to provide a single, small apparatus capable of elemental and structural analysis of inorganic matter by utilizing X-rays having non-obstructive and non-contact characteristics there is provided a small, energy distribution type X-ray detector for detecting X-ray fluorescence and subjecting the X-ray fluorescence to elemental and quantative analysis, and a CCD line sensor for performing structural analysis. An X-ray tube target structure that is a Cu layer on an Mo layer is adopted. When excitation is performed using a low accelerating voltage, this is made monochromatic by using a Cu filter to filter the Cu-K lines and the continuous X-rays generated, with the radiation quality (Cu-K lines) thus generated then being utilized in X-ray diffraction. When excitation is performed using a high accelerating voltage, Cu-K lines of the Cu-K lines, Mo-K lines and continuous X-rays thus generated are blocked by absorption using an Mo or Zr filter, with the Mo-K lines and continuous X-rays thus obtained being utilized in X-ray fluorescence analysis.

Combined x-ray analysis apparatus

The invention refers to an X-ray beam device for X-ray analytical applications, comprising an X-ray source designed such as to emit a divergent beam of X-rays; and an optical assembly designed such as to focus said beam onto a focal spot, wherein said optical assembly comprises a first reflecting optical element, a monochromator device and a second reflecting optical element sequentially arranged between said source and said focal spot, wherein said first optical element is designed such as to collimate said beam in two dimensions towards said monochromator device, and wherein said second optical element is designed such as to focus the beam coming from said monochromator device in two dimensions onto said focal spot.

X-ray beam device

An angular analysis system that can be controlled to receive radiation at a defined angle from a defined focus region. The angular analysis system is used for level 2 inspection in an explosive detection system. Level 2 inspection is provided by a three-dimensional inspection system that identifies suspicious regions of items under inspection. The angular analysis system is focused to gather radiation scattered at defined angles from the suspicious regions. Focusing may be achieved in multiple dimensions by movement of source and detector assemblies in a plane parallel to a plane holding the item under inspection. Focusing is achieved by independent motion of the source and detector assemblies. This focusing arrangement provides a compact device, providing simple, low cost and accurate operation.

Inspection system with material identification

An X-ray condenser for condensing X-rays radiated from an X-ray source to a very small condensing spot is disclosed. X-rays from the X-ray source are formed to a parallel X-ray beam by a parallel type parabolic reflection mirror. The parallel X-ray beam is made monochromatic by an analyzing crystal and condensed to the condensing spot by a zone plate. The zone plate is constructed by alternately arranging a plurality of X-ray transmitting bands and a plurality of X-ray shielding bands and can condense the parallel X-ray beam to a very small focus point.

X-ray condenser and x-ray apparatus

PROBLEM TO BE SOLVED: To improve a method of arranging and installing an X-ray detector for a fluorescent X-ray measurement in an X-ray apparatus which performs an X-ray diffraction measurement and the fluorescent X-ray measurement and to enhance the measuring accuracy of both measurements. SOLUTION: An X-ray apparatus is provided with an X-ray source 1 which radiates X-rays, with an X-ray counter 6 which detects X-rays diffracted by a sample 8, with a semiconductor detector (SSD) 23 which detects fluorescent X-rays generated from the sample 8, with a θ-rotation driving system 9 by which the sample is turned by θ with reference to the X-ray source 1 around a sample axial line ω and with a 2θ-rotation driving system by which the X-ray counter 6 is turned by 2θ with reference to the X-ray source 1 around the sample axial line ω. The SSD 23 is moved so as to be brought close to, or separated from, the sample 8 while it is interlocked with a θ-rotation between the X-ray source 1 and the sample 8 and with a 2θ-rotation between the X-ray source 1 and the X-ray counter 6. In this manner, the SSD 23 is advanced or retreated with reference to an X-ray optical system.

X-ray apparatus for x-ray diffraction measurement and for fluorescent x-ray measurement

PROBLEM TO BE SOLVED: To form an X-ray beam with its great intensity using an X-ray source with its small X-ray output by constituting a transmission type target and a plurality of X-ray wave guide fine tubes at one end into contact with an X-ray radiation face of this target and at the other end comprising the X-ray radiation port. SOLUTION: This X-ray generator comprises a transmission type target 8 for radiating X-ray from an opposite face when an electron collides with one face and the plurality of X-ray wave guide fine tubes 2 at one end proximal to or coming into contact with an X-ray radiation face of the transmission type target 8 and at the other end comprising an X-ray radiation port 12. Since it is important to collect X-rays by an X-ray generation source having its relatively wide area, that is, by X-ray wave guide fine tubes 2 from each X-ray generation point in the target, the transmission type target 8 may preferably be a planar target having a greater area than a sectional area of one X-ray wave guide fine tube 2. The X-ray radiation port 12 formed by bundling the plurality of X-ray wave guide fine tubes 2 can be arbitrarily employed, for example, circular, rectangular, or linear shape.

X-ray generator and x-ray device using the same

PROBLEM TO BE SOLVED: To provide an X-ray diffraction apparatus which enables freely selection of both of a sample limited measurement to be performed as for a specified sample with an X-ray counter fixed and a continuous high resolutions measurement to be performed with an view to obtain a continuous X-ray diffraction graphic by rotatively moving the X-ray counter in scanning. SOLUTION: This X-ray diffraction apparatus has a CCD X-ray detector 7 having a positional resolutions within a linear range and a detector function switching device 6. The function switching device 6 switches the following two positions of the CCD detector 7: the zero-dimensional measuring position P at which the range of detecting X rays is in the tangential direction of a Debye ring Q of diffraction X rays and the one-dimensional measuring position L at which the range of detecting X rays is in the radial direction of the Debye ring Q. The CCD detector 7 placed at the zero-dimensional measuring position P detects the intensity of X rays being turned by 2 and the detector 7 at the one-dimensional measuring position L detects the intensity of X rays by being fixed.

X-ray diffraction apparatus with linear x-ray detector

PROBLEM TO BE SOLVED: To provide an X-ray concentrating device capable of extremely reducing the size of a concentrated point of an X-ray. SOLUTION: This X-ray concentrating device 16 concentrates an X-ray R0 radiated from an X-ray source F into a microscopic concentrated point P. The X-ray R0 radiated from the X-ray source F is formed into a parallel X-ray beam R2 by a parallel paraboloid reflector 17, this parallel X-ray beam R2 is turned into monochrome by an analyzing crystal 18, and the monochrome parallel X-ray beam is condensed into a condensing point P by a zone plate 19. The zone plate 19 is formed by mutually arranging X-ray transmission bands and X-ray screening bands and it can converge an X-ray into an extremely microscopic focal point when a parallel X-ray beam is emitted onto it.

Katsuhiko Ogiso

Papers

X-ray condenser and x-ray apparatus

X-ray apparatus for x-ray diffraction measurement and for fluorescent x-ray measurement

X-ray generator and x-ray device using the same

X-ray diffraction apparatus with linear x-ray detector

X-ray concentrating device and x-ray device