K
Keizo Yamada
Researcher at NEC
Publications - 21
Citations - 317
Keizo Yamada is an academic researcher from NEC. The author has contributed to research in topics: Layer (electronics) & Electrode. The author has an hindex of 8, co-authored 21 publications receiving 317 citations.
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Patent
Presentation supporting device
TL;DR: In this article, the authors present a presentation supporting device having excellent operability and adaptability to oral presentations in a computer multimedia environment, where the first and second accelerometers detect first-and second acceleration of gravity resulting from inclinations in firstand second sensitivity axis directions perpendicular to each other.
Patent
Semiconductor device tester which measures information related to a structure of a sample in a depth direction
TL;DR: In this paper, the current produced in a sample 5 by irradiating the sample with parallel electron beam 2 is measured by an ammeter and the measurement is repeated while changing acceleration voltage of electron beam 1.
Patent
Electron beam radiator with cold cathode integral with focusing grid member and process of fabrication thereof
TL;DR: In this paper, the first and second laminated sub-structures are fixed to each other through a field assisted glass-metal sealing technique by means of a stepper, and a grid member on the transparent upper insulating layer is fixed to the first sub-structure.
Patent
Semiconductor device tester and semiconductor device test method
TL;DR: In this article, a plurality of measuring positions on a sample are sequentially irradiated with electron beams having identical cross sectional shapes, and the measured currents or physical amounts derived from the measured current are displayed on a two-dimensional plane as a function of measuring position.
Patent
Semiconductor acceleration sensor and method of fabrication thereof
TL;DR: In this paper, an acceleration sensor is provided with damping means on an upper surface and/or an lower surface of a movable portion of a sensor body and opposite regions surrounded by the movable part and a rim of the sensor body.