L
Layton Eagar
Researcher at Microchip Technology
Publications - 5
Citations - 112
Layton Eagar is an academic researcher from Microchip Technology. The author has contributed to research in topics: Voltage divider & Voltage regulator. The author has an hindex of 5, co-authored 5 publications receiving 112 citations.
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Patent
Configurable operational amplifier as a microcontroller peripheral
TL;DR: The configurable operational amplifier (200) as discussed by the authors is a configurable amplifier that can be programmed to specific characteristics and parameters for various requirements in the measurement of analog signals, such as gain bandwidth product (GBWP), selection of op-amp or comparator modes of operation, input offset zero calibration, ultra low bias current, rail-to-rail input operation, and output operation.
Patent
Auto-calibration circuit to minimize input offset voltage in an integrated circuit analog input device
TL;DR: An auto-calibration circuit minimizes input offset voltage in an integrated circuit analog input device as mentioned in this paper, which can also calibrate a plurality of analog input devices in a multi-chip package (MCP).
Patent
Bandgap voltage comparator used as a low voltage detection circuit
Layton Eagar,Willem Smit +1 more
TL;DR: In this article, a bandgap voltage comparator is used to detect low voltage conditions for an logic on an integrated circuit that may be powered from a battery, fuel cell, solar cell and the like.
Patent
Method of using a bandgap voltage comparator in a low voltage detection circuit
Layton Eagar,Willem Smit +1 more
TL;DR: In this paper, a bandgap voltage comparator is used to detect low voltage conditions for an logic on an integrated circuit that may be powered from a battery, fuel cell, solar cell and the like.
Patent
Wake-up reset circuit draws no current when a control signal indicates sleep mode for a digital device
TL;DR: A wake-up reset circuit as discussed by the authors generates a reset signal to a digital circuit upon a wakeup event, even if a brown out condition occurs which may have caused unstable and unknown logic states in sequential circuit elements, e.g., volatile memory, flip flops and/or latching circuits.