Monte Carlo Methods. By J. M. Hammersley and D. C. Hands-Comb. Pp. 178. 21s. 1964. (Methuen, Monographs on Applied Statistics and Probability.)

Errors and conflicts exist in many systems. A fundamental question from industries is How can errors and conflicts in systems be eliminated by automation, or can we at least use automation to minimize their damage? The purpose of this chapter is to illustrate a theoretical background and applications of how to automatically prevent errors and conflicts with various devices, technologies, methods, and systems. Eight key functions to prevent errors and conflicts are identified and their theoretical background and applications in both production and service are explained with examples. As systems and networks become larger and more complex, such as global enterprises and the Internet, error and conflict prognostics and prevention become more important and challenging; the focus is shifting from passive response to proactive prognostics and prevention. Additional theoretical developments and implementation efforts are needed to advance the prognostics and prevention of errors and conflicts in many real-world applications.

Automating Errors and Conflicts Prognostics and Prevention

The Monte Carlo (MC) simulation method is applied to the luminous intensity distributions (LID) of luminaires. The widely used twin fluorescent lamp luminaire with louvre is taken as the model. The influences of reflectance and louvre shape on the LID are investigated by simulating the emission, reflection, and absorption of light. MC methods are a novel approach to the optimal design of louvre lighting.

Luminous intensity characteristics of luminaires : Monte Carlo simulation

Construction of fiber-optic bundle light-collection systems and calculations of collection efficiency

Automating E 30. Automating Errors and Conflicts Prognostics and Prevention

The lighting affects the cost, stability and quality of image formation in an inspection system. The inspection results are simultaneously affected by such as the light configuration, the reflectance of the inspected object, and the performance of lens, therefore it is difficult to supply the resolution either by measuring or analytical methods. The illumination effect of two different light sources in an automatic inspection system is studied by means of Monte Carlo (MC) method in this paper. The theoretical analysis and simulation results reveal as follows: It is possible to examine the performance of the different light sources and the reflection characteristics of the inspected object in an automatic inspection system by MC simulation method. When the size and the surface roughness of the inspected object vary, the collection result of lens under a desired annular light source has a better effect than under a sloped planar light source. However, with the reflector depth of the annular fluorescent lamp increasing, the efficiency decreases. This research not only supplies an available method for the analysis of light configuration but also points out a new way for light source selection in an automatic inspection system.

Optimizing the Lighting in Automatic Inspection System using Monte Carlo Method

In an automatic inspection system, the improvement in image quality has a close relationship with aberration of the detecting lens. A new analysis method for aberration using the Monte Carlo method is presented in this paper. The theoretical analysis and simulation results reveal the following: The aberration is related to the relative ray height in the entrance pupil. In the presence of aberration, there exist some symmetric distortions in the margin of the pattern, and if the two lenses have equal but opposite ray aberration, these aberrations can exactly cancel each other. This research not only supplies a new way for analyzing the aberration in lenses but also points out an available method for analyzing the automatic inspection system.

An Application of Monte Carlo Method on Simulating Optical Aberration of Automatic Inspection System.

The improvement of image quality has a close relation with lighting and lens in an automatic inspection system. The quality of image could affect the cost, speed and stability of an inspection system. The influences of the lighting configuration and the spherical aberration of lens in an automatic inspection system are studied by means of Monte Carlo (MC) method in this paper. The theoretical analysis and simulation results reveal as follows: when the light source deviates from the center of the inspection system, the planar light source with a large (small) inclination has a better illumination in the near (far) distance within a narrow (broad) scope. The illumination scope becomes broader as the sloped light source deviates from the center of the inspection system. There exist some symmetric distortions in the margin of the pattern while the spherical aberration presents. This research not only supplies an available method for the analysis of lighting configuration but also points out a new way for analyzing the aberration of lens.

Li Chen

Papers

Optimizing the Lighting in Automatic Inspection System using Monte Carlo Method

An Application of Monte Carlo Method on Simulating Optical Aberration of Automatic Inspection System.

Study on Optimal Lighting Configuration and Aberration of Inspection System by Monte Carlo Method

Research on Reflection Characteristics of IC Substrate in Automatic Inspection System by Monte Carlo Method