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Mariusz Jancelewicz

Researcher at Adam Mickiewicz University in Poznań

Publications -  25
Citations -  703

Mariusz Jancelewicz is an academic researcher from Adam Mickiewicz University in Poznań. The author has contributed to research in topics: Atomic layer deposition & Spectroscopy. The author has an hindex of 12, co-authored 24 publications receiving 550 citations.

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Structural and XPS characterization of ALD Al2O3 coated porous silicon

TL;DR: Al 2 O 3 thin films were grown on highly-doped p-Si (100) macro-and mesoporous structures by atomic layer deposition (ALD) using trimethylaluminum (TMA) and water H 2 O as precursors at 300°C as discussed by the authors.
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Structural and XPS studies of PSi/TiO2 nanocomposites prepared by ALD and Ag-assisted chemical etching

TL;DR: In this article, the morphology and phase structure of PSi/TiO2 nanocomposites fabricated by ALD and metal-assisted chemical etching (MACE) were investigated.
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Study on Structural, Mechanical, and Optical Properties of Al2O3–TiO2 Nanolaminates Prepared by Atomic Layer Deposition

TL;DR: In this paper, structural, optical, and mechanical properties of Al2O3/TiO2 nanolaminates fabricated by atomic layer deposition (ALD) were investigated, and it was shown that with decreasing of the layer thickness, the value of band gap energy increases due to the quantum size effect related to the reduction of the nanograins size.
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Atomic layer deposition TiO2 coated porous silicon surface: Structural characterization and morphological features

TL;DR: In this paper, the mean size of TiO2 crystallites was determined by TEM, XRD and Raman spectroscopy, and the morphology of the deposited films and initial silicon nanostructures were investigated by scanning electron microscopy and X-ray diffraction.