Showing papers by "Mark Halpern published in 1987"
TL;DR: In this paper, it was shown that the expression 1/(T)1/2 =A+B(ln(R−R0)+C(ln2(R −R 0)+D(ln3(R+!iR0) R−R 0) provides a very good description of the thermometer temperature T as a function of device resistance R.
Abstract: Preparation of thermometers from carbon composition resistors to avoid large changes during repeated thermal cycling is discussed. Furthermore, it is found that the expression 1/(T)1/2 =A+B ln(R−R0)+C ln2(R−R0)+D ln3(R−!iR0) R−R0) provides a very good description of the thermometer temperature T as a function of device resistance R. Fitting accuracies of δT<1 mK at cryogenic temperatures are achieved. The value of R0 can be chosen so that the residual errors are not more than 10 K even up to room temperature.
5 citations