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Mark J. Rosker

Researcher at DARPA

Publications -  12
Citations -  228

Mark J. Rosker is an academic researcher from DARPA. The author has contributed to research in topics: Gallium nitride & Transistor. The author has an hindex of 7, co-authored 12 publications receiving 211 citations.

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Proceedings ArticleDOI

THz electronics projects at DARPA: Transistors, TMICs, and amplifiers

TL;DR: A technology base is being established to effectively generate, detect, process, and radiate sub-MMW frequencies to exploit this practically inaccessible frequency domain for imaging, radar, spectroscopy, and communications applications.
Proceedings ArticleDOI

Imaging Through the Atmosphere at Terahertz Frequencies

TL;DR: In this article, the authors investigate the current understanding of the phenomenological concerns and there impact on requirements for electronic components and imaging architectures that will produce sensors capable of detecting, and perhaps identifying, concealed objects that may form a security risk.

The DARPA Wide Band Gap Semiconductors for RF Applications (WBGS-RF) Program: Phase II Results

TL;DR: In this paper, the authors summarized the significant progress made by the contractor teams participating in the Phase II portion of the WBGS-RF program, and concluded that the lifetime of high performance gallium nitride high electron mobility transistors, operating at frequencies up to 40 GHz, could be extended.
Proceedings ArticleDOI

The DARPA COSMOS program: The convergence of InP and Silicon CMOS technologies for high-performance mixed-signal

TL;DR: The COmpound Semiconductor Materials On Silicon (COSMOS) program of the US Defense Advanced Research Projects Agency (DARPA) focuses on developing transistor-scale heterogeneous integration processes to intimately combine advanced compound semiconductor (CS) devices with high-density silicon circuits as mentioned in this paper.
Proceedings ArticleDOI

DARPA's Nitride Electronic NeXt Generation Technology Program

TL;DR: The Next Generation HEMT (NEXT) project as mentioned in this paper demonstrated 300 GHz D-mode and 200 GHz E-mode HEMTs while maintaining the breakdown voltage and transistor cutoff frequency product of more than 5 THz•Volt, and the final goal is to enable a 1000-transistor, high-yield, 500 GHz E/D-mode GaN technology for mixed signal applications.