N
Narihiro Morosawa
Researcher at Sony Broadcast & Professional Research Laboratories
Publications - 34
Citations - 1315
Narihiro Morosawa is an academic researcher from Sony Broadcast & Professional Research Laboratories. The author has contributed to research in topics: Thin-film transistor & Oxide thin-film transistor. The author has an hindex of 18, co-authored 34 publications receiving 1292 citations.
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Patent
Thin film transistor and display device
TL;DR: In this paper, a thin-film transistor capable of improving reliability in the thin-layer transistor including an oxide semiconductor layer is presented, provided that a gate electrode, a gate insulating film, and a source/drain electrode are available.
Patent
Thin-film transistor, method of manufacturing the thin-film transistor, and display device
TL;DR: In this paper, a thin-film transistor was proposed, which has a uniform and good electric characteristic and has a simple configuration allowing decrease in number of manufacturing steps, and a method of manufacturing the thin film transistor.
Journal ArticleDOI
41.2: Micro Silicon Technology for Active Matrix OLED Display
Toshiaki Arai,Narihiro Morosawa,Yasunobu Hiromasu,Hidaka Koji,Tetsuo Nakayama,Atsuya Makita,Motohiro Toyota,Naoki Hayashi,Yoshimura Yusuke,Ayumu Sato,Kimiyasu Namekawa,Yoshio Inagaki,Nobuhiko Umezu,Koichi Tatsuki +13 more
TL;DR: In this paper, the micro crystalline silicon TFTs formed by dLTA (diode laser thermal Anneal) system realized uniform and stable current flow in large display area.
Journal ArticleDOI
35.3: Distinguished Paper: A Novel Self‐Aligned Top‐Gate Oxide TFT for AM‐OLED Displays
TL;DR: A 9.9‐inch diagonal qHD AM‐OLED display was demonstrated to provide applicable solution for a large‐sized and ultra‐high definition OLED mass production.
Patent
Thin-film transistor, method of manufacturing the same, and display device
TL;DR: In this article, a thin film transistor with an oxide semiconductor layer including a source region, a drain region, and a channel region is presented, where a portion of the source and drain regions includes a dopant selected from the group consisting of aluminum, boron, gallium, indium, titanium, silicon, germanium, tin, lead, and combinations thereof.