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Nisan Siegel
Researcher at Johns Hopkins University
Publications - 23
Citations - 529
Nisan Siegel is an academic researcher from Johns Hopkins University. The author has contributed to research in topics: Holography & Digital holographic microscopy. The author has an hindex of 8, co-authored 23 publications receiving 453 citations.
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Theoretical and experimental demonstration of resolution beyond the Rayleigh limit by FINCH fluorescence microscopic imaging.
TL;DR: This work further analyzed FINCH in view of linear system theory and in comparison to conventional coherent and incoherent two dimensional imaging systems, and demonstrates improved resolution by FINCH, when compared to conventional imaging.
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Optimal resolution in Fresnel incoherent correlation holographic fluorescence microscopy
TL;DR: Experiments are reported which have led to the optimal optical, electro-optic, and computational conditions necessary to produce holograms which yield high quality 3D images from fluorescent microscopic specimens.
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In-line FINCH super resolution digital holographic fluorescence microscopy using a high efficiency transmission liquid crystal GRIN lens
TL;DR: A new optical arrangement that creates high-efficiency, high-quality Fresnel incoherent correlation holography (FINCH) holograms using polarization sensitive transmission liquid crystal gradient index (TLCGRIN) diffractive lenses is reported.
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High-magnification super-resolution FINCH microscopy using birefringent crystal lens interferometers.
TL;DR: In-line incoherent interferometers made from uniaxial birefringent α-barium borate or calcite crystals are reported that overcome the aberrations and distortions present with previous implementations that employed spatial light modulators or gradient refractive index lenses.
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Reconstruction of objects above and below the objective focal plane with dimensional fidelity by FINCH fluorescence microscopy
TL;DR: This work has analyzed the effects of transverse magnification and optimal reconstruction depth based on the longitudinal distance of objects from the focal plane of the input lens for two configurations of a FINCH fluorescence microscopy system.