The method involves heating laminating layers eg laminating films (2), on laminating temperature in a heating phase, where the laminating layers are held in a holding phase for a holding period on the laminating temperature A dielectric property eg ion viscosity or internal conductivity, of the laminating layers is monitored during a heating and/or holding phase using dielectric and thermal analysis, where the heating and/or holding phase are completed as a function of the monitored dielectric property An independent claim is also included for a device for controlling a temperature profile in a thermal lamination process during manufacturing photovoltaic modules or laminated glasses

Method for controlling temperature profile in thermal lamination process during manufacturing e.g. photovoltaic modules, involves monitoring property during heating and/or holding phase, where phase is completed as function of property

Provided are a processing device (1) and a method making it possible to accurately measure the substance temperature of a workpiece housed in a chamber and heated. The processing device (1) is provided with the chamber (2) for housing the workpiece (W), a measurement piece (6) provided in the chamber (2), and a measurement unit (8). The measurement piece (6) thermally expands and contracts due to the effect of the temperature in the chamber (2). The measurement unit (8) measures the amount of thermal expansion and contraction of the measurement piece (6) and thereby measures the substance temperature of the workpiece (W).

Processing device and method for measuring workpiece temperature in processing device

PROBLEM TO BE SOLVED: To perform a treatment, while accurately measuring the actual temperature of a workpiece, when the workpiece is stored inside a chamber and heated.SOLUTION: In a treatment apparatus 1 for performing a modification treatment to a workpiece W stored inside a chamber 2, a measurement piece 6 thermally expanded/contracted by an influence of the inside temperature of the chamber 2 is provided inside the chamber 2, and further a measurement part 8 for measuring the actual temperature of the workpiece W by measuring a thermally expanded/contracted amount of the measurement piece 6 is provided.

Treatment apparatus and temperature measuring method of workpiece

A processing apparatus and a method capable of accurately measuring a real temperature of a workpiece contained and heated in a chamber. The processing apparatus includes a chamber containing a workpiece, a measurement piece installed in the chamber, and a measuring unit. The measurement piece is capable of thermal expansion and contraction in response to an internal temperature of the chamber. The measuring unit measures a thermal expansion and contraction amount of the measurement piece to thereby measure the real temperature of the workpiece.

Processing apparatus and method of measuring temperature of workpiece in processing apparatus

The invention relates to a method for determining at least one thermal property of a sample material, comprising: Rigidly connecting a sample strip (1) of the sample material to a reference strip (2) of a reference material to form a double strip (3), bending the double strip (3) by changing an ambient temperature (T1, T2) of the double strip (3), determining a difference (ΔLP –Δ LR) in a change in length between the sample strip (1) and the reference strip (2) as the double strip (3) is bent, and determining the at least one thermal property of the sample material on the basis of the difference (ΔLP – Δ LR) in the change in length. The thermal property can be, for example, the thermal coefficient of expansion, or a zero-crossover temperature of the sample material.

Method for determining at least one thermal property of a sample material

A reference substance/temperature converter (29) converts a measurement value of a physical characteristic at any time in the temperature of the reference substance (2) at this time. An information concerning the change of the physical characteristic of the reference substance is changed continuously into a temperature detection signal, which registers the sample temperature. An Independent claim is included for: (a) a method for the thermal analysis for the exact measurement of a temperature of a sample with a large diameter

Device for analysis for exact temperature measurement of sample with large diameter has reference substance/temperature converter that converts measurement value of physical characteristic in temperature of reference substance

Under a same heating condition as a sample to be measured, a physical property is measured for a reference substance whose temperature dependency of a physical property value is previously known. Reversely, a temperature profile of the reference substance is read so that the temperature profile is applied to a physical property measurement result for the sample. Thus, thermal analysis for the large diameter sample is made accurately without the necessity of arranging a temperature sensor in the vicinity of the sample.

Thermal analysis apparatus and method capable of accurately measuring a temperature of a large diameter sample

PROBLEM TO BE SOLVED: To obtain the temperature of a sample through the observation of the amount of inflation of a reference substance by continuously measuring the physical properties of the reference substance where the temperature dependency of a physical property value is known and a sample to be measured under identical heating conditions, and converting the signal change of the obtained physical properties into a temperature change signal. SOLUTION: When an operator sets a desired temperature program to a traveling mechanism 22 and gives an instruction, temperatures of a material 1 and a reference substance 2 change by scanning the temperature of a heating oven 21. The sample 1 and the reference substance 2 are inflated with temperature increase, and the amount of inflation appears as a relative displacement for differential transformers 7b and 8b of cores 7a and 8a being provided at a sample-side probe 5 and a reference-side probe 6, and is detected by a sample inflation measurement circuit 27 and a reference inflation measurement circuit 28. Since the reference substance 2 has a known inflation rate, an average temperature is determined from the amount of inflation of the substance 2. A reference inflation/temperature converter 29 converts the amount of inflation of the substance 2 into the temperature of the substance 2. Since the sample 1 is placed under the same conditions as the substance 2, the output of the converter 29 becomes the temperature signal of the sample 1.

Nobutaka Nakamura

Papers

Device for analysis for exact temperature measurement of sample with large diameter has reference substance/temperature converter that converts measurement value of physical characteristic in temperature of reference substance

Thermal analysis apparatus and method capable of accurately measuring a temperature of a large diameter sample

Thermal analysis device and method for accurately measuring temperature of large-diameter sample