An overview of radiation effects on electronic devices under severe accident conditions in NPPs, rad-hardened design techniques and simulation tools

Total ionizing dose (TID) radiation tests of complex multifunctional Very-large-scale integration (VLSI) integrated circuits (ICs) rise up some particularities as compared to conventional “simple” ICs. The main difficulty is to organize informative and quick functional tests directly under irradiation. Functional tests approach specified for complex multifunctional VLSI devices is presented and the basic radiation test procedure is discussed in application to some typical examples.

https://ieeexplore.ieee.org/iel7/6828884/6842067/06842189.pdf

TID behavior of complex multifunctional VLSI devices

The paper analyzes the effectiveness of test algorithms of different duration during the functional control of static random access memory (SRAM) during the exposure to total ionizin dose (TID). The results of experimental research SRAM chips using an automated system based on the equipment «PXI» company National Instruments, justifying the use of the test algorithms such as “MARCH” (long-10N).

Automatic control system for memory chips performance in a radiation experiment

Total ionizing dose (TID) effects and radiation tests of complex multifunctional Very-large-scale integration (VLSI) integrated circuits (ICs) rise up some particularities as compared to conventional "simple" ICs. The main difficulty is to organize informative and quick functional test dirctly under irradiation. Functional tests approach specified for complex multifunctional VLSI devices is presented and the basic radiation test procedure is discussed in application to some typical examples.

/pdf/total-ionizing-dose-effects-and-radiation-testing-of-complex-2jfgw9vzlf.pdf

Total ionizing dose effects and radiation testing of complex multifunctional vlsi devices

The article discusses the creation of automated system for I–V measurements of CMOS SOI transistor test structures based on National Instruments PXI platform. The article describes the measurement system circuit diagram and its components. Article describes measurement process, user interface and resulting current-voltage characteristic example.

Automated I–V measurement system for CMOS SOI transistor test structures

The paper presents total ionizing dose (TID) distribution due to trapped electrons and protons at the system on module (SOM) surface. TID calculation was made in 3D_SPACE software (Specialized Electronic Systems). The main goal of this paper is a more precise definition of the radiation hardness requirements for space electronics. A huge TID level dispersion for different ICs in SOM is demonstrated. Basic Al sphere approach for TID spacecraft requirements calculations is shown to provide overestimated conservative results.

/pdf/system-on-module-total-ionizing-dose-distribution-modeling-45q8vkf810.pdf

System on module total ionizing dose distribution modeling

The developed automated setup for functional and parametric control of 8-bit microcontrollers during radiation hardness tests is presented. The setup hardware is based on the NI modular instruments PXI-7841R and PXI-4110 operated under LabVIEW software. Test circuit and methods together with the user software structure and typical test results are presented.

Automated radiation test setup for functional and parametrical control of 8-bit microcontrollers

The analysis results of typical radiation faults of the system-on-chip have been presented. The specifics of digital, analog-to-digital (mixed), and microwave system-on-chip are considered. A set of the basic parameters-criteria for the radiation hardness of system-on-chip of various classes is determined. Methodical and technical designs for controlling the operability of the System-on-chip by carrying out radiation tests are proposed.

P. V. Nekrasov

Papers

System on module total ionizing dose distribution modeling

Total ionizing dose effects and radiation testing of complex multifunctional vlsi devices

Automated I–V measurement system for CMOS SOI transistor test structures

Automated radiation test setup for functional and parametrical control of 8-bit microcontrollers

System-on-chip: Specifics of radiation behavior and estimation of radiation hardness