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Patrick Vandewalle
Researcher at Katholieke Universiteit Leuven
Publications - 64
Citations - 1719
Patrick Vandewalle is an academic researcher from Katholieke Universiteit Leuven. The author has contributed to research in topics: Computer science & Depth map. The author has an hindex of 15, co-authored 52 publications receiving 1635 citations. Previous affiliations of Patrick Vandewalle include Dolby Laboratories & École Normale Supérieure.
Papers
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Journal ArticleDOI
Deep learning based sinogram interpolation applied to X-ray CT measurements of polymer additive manufacturing parts
TL;DR: In this article , a conditional generative adversarial network (cGAN) is used to increase the number of X-ray projections before reconstruction to enhance low-quality XCT scans.
How much depth information can radar contribute to a depth estimation model?
Chen-Chou Lo,Patrick Vandewalle +1 more
TL;DR: In this article , the intrinsic depth potential of radar data was investigated using state-of-the-art monocular depth estimation models on the nuScenes dataset, and the model predicted depth by taking only radar as input to demonstrate the inference capability using radar data.
Patent
Method and apparatus for three-dimensional image forming
TL;DR: In this paper, a first image forming module is used to form an intermediate 3D image, wherein the number of image blocks is different for two areas from plurality of regions, and each image block contains pixel values for group of pixels corresponding to direction of view.
Journal ArticleDOI
Few-shot learning on point clouds for railroad segmentation
TL;DR: In this paper , the authors propose a railroad segmentation method that leverages few-shot learning by generating class prototypes for the most relevant infrastructure classes in low-labeled data.
Journal ArticleDOI
A machine learning supported sinogram interpolation method for X-ray computed tomography
TL;DR: In this article , a sinogram interpolation method that incorporates the object rotation is proposed to expand the applicability of X-ray computed tomography (XCT) towards low-end parts.