P
Petr Hlubina
Researcher at Technical University of Ostrava
Publications - 211
Citations - 2250
Petr Hlubina is an academic researcher from Technical University of Ostrava. The author has contributed to research in topics: Interferometry & Michelson interferometer. The author has an hindex of 26, co-authored 202 publications receiving 1971 citations. Previous affiliations of Petr Hlubina include Silesian University & University of Wrocław.
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White-light spectral interferometry with the uncompensated Michelson interferometer and the group refractive index dispersion in fused silica
TL;DR: In this paper, the authors measured the equalization wavelength as a function of the displacement in the Michelson interferometer by a low-resolution miniature fiber-optic spectrometer and confirmed that the group refractive index dispersion in the beam splitter made of fused silica agrees well with that resulting from the Sellmeier dispersion equation.
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Dispersion of group and phase modal birefringence in elliptical-core fiber measured by white-light spectral interferometry.
TL;DR: A white-light spectral interferometric technique employing a low-resolution spectrometer for measurement of the dispersion of the group and phase modal birefringence in an elliptical-core optical system over a wide spectral range is presented.
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Windowed Fourier transform applied in the wavelength domain to process the spectral interference signals
TL;DR: In this article, a new method based on a windowed Fourier transform applied in the wavelength domain was proposed for processing the spectral interference signals by using a cube beamsplitter made of BK7 glass.
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Measurement of the group dispersion of the fundamental mode of holey fiber by white-light spectral interferometry
TL;DR: A new method for measuring the group dispersion of the fundamental mode of a holey fiber over a wide wavelength range by white-light interferometry employing a low-resolution spectrometer is presented and good agreement between experiment and theory is demonstrated.
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Dispersive white-light spectral interferometry with absolute phase retrieval to measure thin film
TL;DR: A white-light spectral interferometric technique for measuring the absolute spectral optical path difference (OPD) between the beams in a slightly dispersive Michelson interferometer with a thin-film structure as a mirror is presented.