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Ri Shien

Publications -  1
Citations -  4

Ri Shien is an academic researcher. The author has contributed to research in topics: Scan line & Sample (graphics). The author has an hindex of 1, co-authored 1 publications receiving 4 citations.

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Patent

High speed displacement/strain distribution measurement method by moire method and measurement device

TL;DR: In this article, the number of scan lines is reduced by using a crossed grating for a sample grating and separated into primary scan moire fringes from one moire fringe image without rotating the sample, and a secondary displacement strain distribution of the structural material is promptly and correctly combined with a high speed moire method.