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Showing papers by "Richard D. Sisson published in 1984"

Journal Article•DOI•
Microstructural characterization of metallic overlay coatings by high resolution analytical electron microscopy

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M. M. Morra1, R.R. Biederman1, Richard D. Sisson1•
Worcester Polytechnic Institute1
28 Sep 1984-Thin Solid Films
TL;DR: In this article, the microstructures of MCrAl-Y coatings have been investigated using high-resolution analytical electron microscopy, and phase identification was accomplished by X-ray diffraction, energy-dispersive Xray spectroscopy, selected area diffraction and convergent beam diffraction of extractions and foils.

11 citations

Book Chapter•DOI•
A Microstructural Study of MCraly Coatings

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M. M. Morra1, Richard D. Sisson1, R.R. Biederman1•
Worcester Polytechnic Institute1
01 Jan 1984
TL;DR: In this article, the application of high resolution electron microscopy (via STEM) to determine the microstructure of MCrAlY coatings is demonstrated, along with proper etchant selection and proper extraction and diffraction.
Abstract: The application of high resolution electron microscopy (via STEM) to determine the microstructure of MCrAlY coatings is demonstrated. The importance of optical and scanning electron microscopy and proper etchant selection is also presented along with x-ray diffraction of extractions as well as bulk samples. These techniques are described in detail.

4 citations