scispace - formally typeset
R

Ruizhi Gao

Researcher at University of Texas at Dallas

Publications -  23
Citations -  1446

Ruizhi Gao is an academic researcher from University of Texas at Dallas. The author has contributed to research in topics: Debugging & Software. The author has an hindex of 10, co-authored 21 publications receiving 1019 citations. Previous affiliations of Ruizhi Gao include Nanjing University.

Papers
More filters
Journal ArticleDOI

A Survey on Software Fault Localization

TL;DR: A comprehensive overview of a broad spectrum of fault localization techniques, each of which aims to streamline the fault localization process and make it more effective by attacking the problem in a unique way is provided.
Journal ArticleDOI

The DStar Method for Effective Software Fault Localization

TL;DR: A technique named DStar (D*) is proposed which can suggest suspicious locations for fault localization automatically without requiring any prior information on program structure or semantics and is found to be more effective at locating faults than all the other techniques it is compared to.
Proceedings ArticleDOI

Software Fault Localization Using DStar (D

TL;DR: A technique named DStar (D*), which has its origins rooted in similarity coefficient-based analysis, is proposed, which can identify suspicious locations for fault localization automatically without requiring any prior information on program structure or semantics.
Journal ArticleDOI

MSeer—An Advanced Technique for Locating Multiple Bugs in Parallel

TL;DR: MSeer—an advanced fault localization technique for locating multiple bugs in parallel is proposed and case studies suggest that MSeer performs better in terms of effectiveness and efficiency than two other techniques for locating Multiple Bug Locator in parallel.
Journal ArticleDOI

Genetic Algorithm-based Test Generation for Software Product Line with the Integration of Fault Localization Techniques

TL;DR: A genetic algorithm-based framework which integrates software fault localization techniques and focuses on reusing test specifications and input values whenever feasible is proposed which can be easily reused between different products of the same family and help reduce the overall testing and debugging cost.