S
S. Camelio
Researcher at University of Poitiers
Publications - 43
Citations - 867
S. Camelio is an academic researcher from University of Poitiers. The author has contributed to research in topics: Thin film & Dielectric. The author has an hindex of 20, co-authored 40 publications receiving 792 citations.
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Anisotropic optical properties of silver nanoparticle arrays on rippled dielectric surfaces produced by low-energy ion erosion
TL;DR: In this article, an ellipsoidal shape with a major axis parallel to the ripples has been fabricated on amorphous dielectric films by ion etching and used as templates to elaborate arrays of aligned Ag nanoparticles by grazing incidence ion-beam sputtering.
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Experimental evidence of nanometer-scale confinement of plasmonic eigenmodes responsible for hot spots in random metallic films
Arthur Losquin,S. Camelio,David Rossouw,Mondher Besbes,Frédéric Pailloux,David Babonneau,Gianluigi A. Botton,Jean-Jacques Greffet,Odile Stéphan,Mathieu Kociak +9 more
TL;DR: In this paper, the authors report on the identification and nanometer scale characterization over a large energy range of random, disorder-driven, surface plasmons in silver semicontinuous films embedded in silicon nitride.
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Advanced optical effective medium modeling for a single layer of polydisperse ellipsoidal nanoparticles embedded in a homogeneous dielectric medium: Surface plasmon resonances
TL;DR: In this paper, the analytical expressions of the effective dielectric tensor of a single layer of polydisperse ellipsoidal nanoparticles with two of their principal axes in the layer's plane and embedded in a homogeneous Dielectric medium are calculated in the quasistatic coupled dipole approximation.
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Quantitative modelling of the surface plasmon resonances of metal nanoclusters sandwiched between dielectric layers: the influence of nanocluster size, shape and organization.
TL;DR: An easy-to-handle model is presented that quantitatively links the nanostructure and optical response of the films, which are considered as dielectric/metal:dielectrics/dielectric trilayers, with the central nanocomposite layer being an effective medium whose optical properties are described by an anisotropic dielectrics tensor.
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In situ optical spectroscopy during deposition of Ag:Si3N4 nanocomposite films by magnetron sputtering
Lionel Simonot,David Babonneau,S. Camelio,David Lantiat,Philippe Guérin,B. Lamongie,V. Antad +6 more
TL;DR: In situ and real-time surface differential reflectance (SDR) spectroscopy is employed to study the growth of metallic Ag and/or dielectric Si 3 N 4 films during deposition by magnetron sputtering as mentioned in this paper.