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S. Devi Mahalakshmi

Researcher at Mepco Schlenk Engineering College

Publications -  17
Citations -  235

S. Devi Mahalakshmi is an academic researcher from Mepco Schlenk Engineering College. The author has contributed to research in topics: Digital image & Digital image processing. The author has an hindex of 3, co-authored 11 publications receiving 169 citations.

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Proceedings ArticleDOI

IOT based crop-field monitoring and irrigation automation

TL;DR: A system is developed to monitor crop-field using sensors and automate the irrigation system, which is 92% more efficient than the conventional approach and will be more useful in areas where water is in scarce.
Journal ArticleDOI

Digital image forgery detection and estimation by exploring basic image manipulations

TL;DR: A technique for image authentication that detects the manipulations that are done in the digital images, including basic image operations such as re-sampling, contrast enhancement and histogram equalization which are often done in forged images.
Journal ArticleDOI

Agro Suraksha: pest and disease detection for corn field using image analysis

TL;DR: In this system diseases/pests are identified at early stages by capturing the images periodically in the agricultural field and the pesticides and other chemicals which are needed to protect the field from further damage will be recommended along with the amount of chemicals needed and the method of usage of those chemicals.
Proceedings ArticleDOI

A forensic method for detecting image forgery

TL;DR: A new method is proposed that makes use of the codebook which is generated from the set of image features to determine the geometric manipulations that are occurred in the received image.
Proceedings ArticleDOI

Age invariant face recognition with occlusion

TL;DR: In face recognition system age variation causes the serious problem, so discriminative model of face recognition is used to deal with age invariant problem and a new technique called Multi Feature Discriminant Analysis (MFDA) was used to reduce the feature space.