S
S. Engert
Researcher at Technische Universität Ilmenau
Publications - 10
Citations - 149
S. Engert is an academic researcher from Technische Universität Ilmenau. The author has contributed to research in topics: Rapid single flux quantum & Detector. The author has an hindex of 4, co-authored 10 publications receiving 140 citations.
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Journal ArticleDOI
Demonstration of digital readout circuit for superconducting nanowire single photon detector.
Thomas Ortlepp,Matthias Hofherr,L. Fritzsch,S. Engert,Konstantin Ilin,D. Rall,Hannes Toepfer,H.-G. Meyer,Michael Siegel +8 more
TL;DR: The SFQ interface circuit simplifies the SNSPD readout and enables large numbers of detectors for future compact multi-pixel systems with single photon counting resolution, thus enabling count-rates of several gigahertz.
Journal ArticleDOI
Orthogonal sequencing multiplexer for superconducting nanowire single-photon detectors with RSFQ electronics readout circuit
Matthias Hofherr,O. Wetzstein,S. Engert,Thomas Ortlepp,B. Berg,Konstantin Ilin,D. Henrich,Ronny Stolz,Hannes Toepfer,Hans-Georg Meyer,Michael Siegel +10 more
TL;DR: An efficient multiplexing technique for superconducting nanowire single-photon detectors based on an orthogonal detector bias switching method enabling the extraction of the average count rate of a set of detectors by one readout line is proposed.
Journal ArticleDOI
Reduced Power Consumption in Superconducting Electronics
TL;DR: In this article, the authors present an assessment of different approaches for reducing the static power consumption by investigating the potential of inductive bias distribution networks as well as reduced critical currents and inductive biasing.
Journal ArticleDOI
Investigation of the relationship between the gray zone and the clock frequency of a Josephson comparator
TL;DR: In this paper, the gray zone dependency on the clock frequency of a Josephson comparator is investigated by simulations concerning the influence of thermal noise, which is performed for a series of operating points defined by the bias current and different noise levels defined by operating temperature.
Journal ArticleDOI
Experimental Analysis of the Bias Dependent Sensitivity of a Josephson Comparator
Taghrid Haddad,S. Engert,Oliver Brandel,Juergen Kunert,Ronny Stolz,Hannes Toepfer,Thomas Ortlepp +6 more
TL;DR: This work analyzes the influence of the bias current on the gray zone of a Josephson comparator and derives a derived normalized dependency that enables the design to certain applications to realize the best trade-off between clock frequency and grey zone.