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S. Koide

Researcher at Nagoya Institute of Technology

Publications -  4
Citations -  37

S. Koide is an academic researcher from Nagoya Institute of Technology. The author has contributed to research in topics: Thin film & X-ray photoelectron spectroscopy. The author has an hindex of 4, co-authored 4 publications receiving 36 citations.

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Thermo-coloration of SmS thin flims by XPS in situ observation

TL;DR: In this article, the surface layer of SmS film was observed to turn from blue-black to gold after annealing at 650°C for 1 1/h in vacuum.
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Fabrication and characterization of metal and semiconductor SmS thin films by rf/dc dual magnetron sputtering

TL;DR: In this article, the phase formation, structure, and optical band gap of polycrystalline metal, intermedium, or semiconductor SmS thin films were identified by XRD, TEM and spectroscopic ellipsometry.
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Fabrication and structural characterization of TiO nanoparticle soft-landed on substrate by the magnetron sputtering-gas aggregation method

TL;DR: In this article, the authors have succeeded to fabricate a thin film consisting of nano-crystallites TiO on a substrate at room temperature by using the magnetron sputtering combined with the gas aggregation method which has the capability to deposit grown small particles and/or clusters of the desired compound material on the substrate in soft-landed mode.
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Optical properties of metal and semiconductor SmS thin films fabricated by rf/dc dual magnetron sputtering

TL;DR: In this paper, the optical properties of both metal and semiconductor phases of SmS thin films on Si substrate grown at a room temperature by dual targets (dc for metal Sm and rf for pressed powdered chalcogenide Sm 2 S 3 ) magnetron sputtering system with the concurrent adjustment of the applied power to respective target, were evaluated by SE at the photon energy range between 0.75 to 5.0