S
Sadafumi Yoshida
Researcher at University of Tokyo
Publications - 8
Citations - 302
Sadafumi Yoshida is an academic researcher from University of Tokyo. The author has contributed to research in topics: Dielectric & Deposition (phase transition). The author has an hindex of 7, co-authored 8 publications receiving 301 citations.
Papers
More filters
Journal ArticleDOI
Optical Properties of Aggregated Silver Films
TL;DR: In this paper, a modification of Schopper's model is proposed, based on the assumption that an aggregated film consists of particles in the shape of rotational ellipsoids.
Journal ArticleDOI
Effect of retarded dipole–dipole interactions between island particles on the optical plasma-resonance absorption of a silver-island film
TL;DR: In this paper, the optical properties of a silver-island film are interpreted by taking account of retarded dipole-dipole interactions between island particles instead of the static-field interaction.
Journal ArticleDOI
Determination of the Inter-Island Dielectric Constant in Aggregated Silver Films, by Measurement of Optical Plasma Resonance Absorption
TL;DR: In this article, the authors derived the relation between the peak wavelengths of absorption bands in terms of the model based on a two-dimensional distribution of island particles and proposed the method for the determination of the inter-island dielectric constant ∊a.
Journal ArticleDOI
Changes of the Optical Properties of Aggregated Silver Films after Deposition
TL;DR: In this article, the changes of the optical properties of aggregated silver films were investigated with an automatic recording ellipsometer immediately after deposition in vacuum and after admission of air into the vacuum chamber.
Journal ArticleDOI
Continuous Ellipsometric Determination of the Optical Constants and Thickness of a Silver Film during Deposition
TL;DR: In this paper, a method for obtaining the optical constants and thickness of thin metal films during deposition using an automatic recording ellipsometer is described, where the restored azimuth ψ, the differential phase change on reflection Δ and the transmittance T have been continuously meaured during the film deposition.