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Sai Krishnam Raju Nadimpalli

Publications -  5
Citations -  153

Sai Krishnam Raju Nadimpalli is an academic researcher. The author has contributed to research in topics: Data structure & Unicode. The author has an hindex of 3, co-authored 5 publications receiving 153 citations.

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Patent

System for organizing and fast searching of massive amounts of data

TL;DR: In this article, the performance metric data is recorded in time-series measurements, converted into unicode, and arranged into a special data structure having one directory for every day which stores all the metric data collected that day.
Patent

System and a process for searching massive amounts of time-series performance data using regular expressions

TL;DR: In this paper, a system to collect and analyze performance metric data recorded in time-series measurements, converted into unicode, and arranged into a special data structure is described, where each attribute has its own section and the performance metric values are recorded in Time Series as unicode hex numbers as a comma delimited list.
Patent

System and a process for searching massive amounts of time-series

TL;DR: In this article, a system to collect and analyze performance metric data recorded in time-series measurements, converted into unicode, and arrange into a special data structure is described, where each attribute has its own section and the performance metric values are recorded as unicode hex numbers as a comma delimited list.
Patent

Organizing and fast searching of data

TL;DR: In this article, the performance metric data is recorded in time-series measurements, converted into unicode, and arranged into a special data structure having one directory for every day which stores all the metric data collected that day.
Patent

System and process for searching massive amounts of time-series data

TL;DR: In this article, the performance metric data is recorded in time-series measurements, converted into unicode, and arranged into a special data structure having one directory for every day which stores all the metric data collected that day.