A data acquisition device, which has an X-ray detector including a plurality of channel widths at which channels at its central portion are fine and channels at its peripheral portions are coarse or rough, and a plurality of data acquisition ranges including a data acquisition range wide in a channel direction and a data acquisition range narrow in the channel direction, and which is capable of performing switching among the data acquisition ranges for each data acquisition, is used to perform data acquisition on the channels fine at the central portion in the data acquisition range narrow in the channel direction, whereby an X-ray CT apparatus is provided which is capable of performing high-resolution imaging and brings about more satisfactory image quality.

X-ray ct apparatus

An X-ray CT apparatus for reconstructing images based on transmitted X-ray detection data acquired by emitting a conical X-ray beam from around an object and outputted from a flat panel X-ray sensor. In advance of CT imaging, a reconstruct area for CT imaging is displayed on a display monitor as superimposed on a fluoroscopic image acquired by irradiating the object with X rays emitted from a selected direction around the object. The operator can determine, before executing the CT imaging, whether a site of interest to be imaged is within the reconstruct area, thereby reliably acquiring CT images of desired sections.

X-ray CT apparatus

PURPOSE: To shorten the time needed for transferring a subject to be examined during data collection and to decrease the time for restricting the subject to be examined by performing an interpolating operation based on the position related to a slice position to X-ray beam data at projection angles before and after the slice position on each projection angle when projection data are obtd. by an interpolation processing on each projection angle. CONSTITUTION: An X-ray tube 3 is constituted in such a way that it is rotated and moved around an inserting hole 6 and X-rays transmitting through a subject to be examined from the X-ray tube 3 are always received by a part of a detector 4. The top board 2 of a bed can be continuously moved along the body axis direction of the subject M to be examined by means of a bed driving and controlling apparatus 8. A data collecting apparatus 9 collects data obtd. by the X-ray detector 4 and an interpolation operating apparatus 10 performs an interpolation operation based on the position related to this slice position to the X-ray beam data of the projection angles before and after the slice position on each projection angle to obtain the projection data. An image reconstituting apparatus 11 reconstitutes a tomographic image at an arbitrary position based on these projection data.

A burn-in board for burn-in and electrical testing of a plurality of integrated circuit devices that are disposed in one or more processing trays may include a substrate having an interface surface and a plurality of electrical contacts disposed on the interface surface for establishing, through engagement with the one or more processing trays, electrical communication between the leads of the integrated circuit devices and a tester. One or more ports may be defined in the substrate so as to extend between the interface surface and another surface of the substrate wherein the port or ports are sized and configured to enable application of a negative pressure between the substrate and the one or more processing trays upon engagement of the substrate therewith and upon application of a vacuum through the one or more ports.

In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing trays

The invention provides a gamma detection device, a collimator for use therein, and use of such a collimator or device in imaging an object. The invention is directed to pinhole imaging with high energy photons, such as 511 keV photons. In order to achieve sufficiently low pinhole knife edge penetration, the collimator uses a plurality of focused clusters of pinholes, each with a smaller opening angle, and arranged such that all the combined fields of view of the individual pinholes in all clusters provide a large central field of view with still compact dimensions of the detection device. This is made possible since the field of view of a single cluster is divided up into a number of individual fields of view.

A focused pinhole gamma detection device

PURPOSE:To improve the picture quality of a reconstituted picture, by obtaining projection data at smaller angle intervals than these of circumferential regions in the fan-shaped center regions of the spreading angle of radiant rays.

Computer tomographic diagnostic equipment

PURPOSE:To distribute radiation passages evenly over the entire sectional plane by making the turning movements of a radiation source and detector for the specimen in a range of more than 180 deg. and so forming the parallel radiation passages for obtaining the projection data of linear scan that the passages of projection directions different by 180 deg. align to themselves.

Computer tomographic diagnosis apparatus

PURPOSE:To obtain a substrate which enables an IC to be mounted and a top lid to be installed stably without any position shift after IC mounting regardless of vibration and wind by providing an cavity internally and lowering the atmospheric pressure by vacuum suction. CONSTITUTION:Suction holes 4 made of small through-holes are provided in the bottom part of the IC mount part 5 of a main body substrate 1 so as to evacuate the IC 9 and a vacuum suction hole 7 is bored in a back lid 6 so as to lower the atmospheric pressure in the cavity 8 provided in the substrate 1. Then, the cavity is evacuated through the vacuum suction hole 7 to lower the atmospheric pressure and in this state, the IC 9 is placed on the IC mount part 5 so that its lead 10 and a contactor 11 are in correct position relation, thereby sucking and fixing the reverse surface of the IC 9 which contacts the IC mount part 5 through the suction holes 4. Then, ICs 9 are placed on all IC mount part 5 and the upper lid 12 is put on them at a correct position by using projection type keys 14 and guide holes 15, so that the leads 10 and contactors 11 are pressed and fixed by lead pressure parts 13 provided to the upper lid 12.

Semiconductor burn-in substrate

PURPOSE:In the fault inspection equipment - in which in order to obtain the fault image of the area to be photographed, information is taken in that is concerned with the fault faces along many passages caused by transmission, radiation and reflection in many directions and this information is used as raw data for reconstructing the fault image by means of logic processing - particularly detailed information is obtained concerning the area of interest within the object area to be photographed.

Fault inspection equipment

PURPOSE:To suppress the generation of artifacts, by making it possible to move freely the starting point of rotary motion by a CT scanner.

Saitou Kiyoto

Papers

Computer tomographic diagnostic equipment

Computer tomographic diagnosis apparatus

Semiconductor burn-in substrate

Fault inspection equipment

Tomographic pickup unit by radiation