Showing papers by "Sergey M. Zharkov published in 2007"
TL;DR: In this article, the growth of palladium black at 130 and 180°C was studied in detail using transmission electron microscopy and X-ray diffraction, and a procedure was proposed for the removal of oxygen from the surface of Palladium black without noticeable changes in its structural characteristics.
Abstract: The growth of palladium black at 130 and 180°C was studied in detail using transmission electron microscopy and X-ray diffraction. It was found that the solution of palladium metal due to the presence of chemisorbed oxygen occurred in hydrochloric acid solutions. A procedure was proposed for the removal of oxygen from the surface of palladium black without noticeable changes in its structural characteristics.
8 citations
TL;DR: In this paper, a fine-grained Co-P medium was found to represent a finegrained medium in which the orientation of crystallites depends on the film thickness, and the texture became stronger at thickness exceeding 500 nm, the c axes were now distributed in the film plane equiprobably.
Abstract: Chemically deposited Co-P films with a P concentration of 2.5% have been studied by X-ray diffraction (Bragg geometry), electron microscopy, and magnetometry. The films have been found to represent a fine-grained medium in which the orientation of crystallites depends on the film thickness. At a thickness less than 70 nm, the films have a certain crystalline texture with a preferred orientation of the hexagonal axis c of the crystallites perpendicular to the film plane. With increasing film thickness, the character of the texture changes; the c axes of crystallites lie now predominantly in the film plane. At thicknesses exceeding 500 nm, the texture becomes stronger; the c axes are now distributed in the film plane equiprobably. These results can be used when producing magnetic media for longitudinal and transverse magnetic recording.
4 citations
TL;DR: In this article, the structure formed during solid-state synthesis in thin bilayer Al/Ni films with the ratio Al: Ni = 60: 40 (at %) has been investigated.
Abstract: The structure formed during solid-state synthesis in thin bilayer Al/Ni films with the ratio Al: Ni = 60: 40 (at %) has been investigated. The films were obtained by thermal evaporation in vacuum with a residual pressure of 10−5–10−6 Torr. Solid-state synthesis was performed by diffusion reaction. The sequence of phase formation upon vacuum annealing of bilayer Al/Ni films has been established: Al + Ni → Al3Ni + Ni (Tann = 180°C) → Al3Ni2 (Tann = 220°C).