S
Shichun Wu
Researcher at University of Electronic Science and Technology of China
Publications - 5
Citations - 70
Shichun Wu is an academic researcher from University of Electronic Science and Technology of China. The author has contributed to research in topics: Thermography & Sparse approximation. The author has an hindex of 3, co-authored 5 publications receiving 30 citations.
Papers
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Journal ArticleDOI
Halogen optical referred pulse-compression thermography for defect detection of CFRP
Shichun Wu,Bin Gao,Yang Yang,Yuyu Zhu,Pietro Burrascano,Stefano Laureti,Marco Ricci,Yizhe Wang +7 more
TL;DR: In this article, the step heating contribution is recorded separately by mean of an additional measurement, which can effectively enhance the defect information and improve the thermal contrast between defect and non-defect areas when halogen lamps are used in combination with pulse-compression in reflection mode.
Journal ArticleDOI
DeftectNet: Joint loss structured deep adversarial network for thermography defect detecting system
TL;DR: A comparison experiment has been undertaken to study the proposed method with other current state-of-the-art deep semantic segmentation algorithms, and shows that the proposed joint loss can better capture the salient features in order to improve the detection accuracy.
Journal ArticleDOI
Structured iterative alternating sparse matrix decomposition for thermal imaging diagnostic system
TL;DR: A structured iterative alternating sparse matrix decomposition to efficiently decompose the input multidimensional data from active thermography into the sum of a low-rank matrix, a sparse matrix, and a noise matrix is proposed.
Journal ArticleDOI
A design of multi-mode excitation source for optical thermography nondestructive sensing
TL;DR: In this paper, the authors presented a novel design of the excitation source with a structure topology that combines the circuit with low frequency sinusoidal generation and a chopper circuit.
Proceedings ArticleDOI
Deep Adversarial Network for CFRP Thermal Imaging Debond Diagnosis
TL;DR: The results show that the proposed joint loss GAN can better capture the defect features to improve the detection accuracy and is being proved to be suitable for the end-to-end detection Thermography diagnosis system.