S
Stuart T. Smith
Researcher at University of North Carolina at Charlotte
Publications - 142
Citations - 3564
Stuart T. Smith is an academic researcher from University of North Carolina at Charlotte. The author has contributed to research in topics: Actuator & Metrology. The author has an hindex of 29, co-authored 141 publications receiving 3233 citations. Previous affiliations of Stuart T. Smith include Griffith University & University of North Carolina at Chapel Hill.
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Book
Flexures: Elements of Elastic Mechanisms
TL;DR: Flexure Design: Advantages and Disadvantages of Flexures as discussed by the authors The main advantages and disadvantages of flexible design are: Basic Elasticity. Fatigue. Vibrations and Natural Frequencies of Continuous Systems.
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Elliptical flexure hinges
TL;DR: In this article, the authors presented closed form equations based on a modification of those originally derived by Paros and Weisbord in 1965, for the mechanical compliance of a simple monolithic flexure hinge of elliptic cross section, the geometry of which is determined by the ratio e of the major and minor axes.
Journal ArticleDOI
Giant magnetoresistance-based eddy-current sensor
Teodor Dogaru,Stuart T. Smith +1 more
TL;DR: In this article, a new eddy-current testing technique for surface or near-surface defect detection in nonmagnetic metals using giant magnetoresistive (GMR) sensors is introduced.
Book
Foundations of ultraprecision mechanism design
TL;DR: In this article, the fundamental concepts in precision design flexure design for positioning and control drive couplings and the mechanics of contact actuators and sensors for controlled displacements materials selection in precision mechanical design are introduced.
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Design and assessment of monolithic high precision translation mechanisms
TL;DR: In this article, a noncontact force transducer using a solenoid and permanent magnet was investigated and it was shown that even with very routine, low-cost manufacturing methods the combination of these devices can produce "slideways" with subnanometer out-of-plane inaccuracies.