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Sun Peize

Researcher at Zhejiang University

Publications -  5
Citations -  134

Sun Peize is an academic researcher from Zhejiang University. The author has contributed to research in topics: Image processing & Deep learning. The author has an hindex of 1, co-authored 5 publications receiving 45 citations.

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A deep-learning-based approach for fast and robust steel surface defects classification

TL;DR: A compact yet effective convolutional neural network model, which emphasizes the training of low-level features and incorporates multiple receptive fields, to achieve fast and accurate steel surface defect classification and adopts the pre-trained SqueezeNet as the backbone architecture.
Patent

Image edge processing method of relay measurement

TL;DR: In this article, the image edge processing method of relay measurement is described, which has the following steps of adjustment device step, identification region dividing step, upper contactextraction step, an image binarization processing step, image statistics step, edge positioning scaling step and image expansion step.
Patent

Image processing and extending method for relay measurement

TL;DR: In this paper, an image processing and extending method for relay measurement is presented, which includes device adjustment step, recognition area division step, upper contact extraction step, image binarization step, an image statistical analysis step, edge positioning scaling step and image extending step.
Patent

Image extraction and image processing method of relay measurement

TL;DR: In this article, an image extraction and image processing method of relay measurement is described, which has the following steps of adjustment device step, identification region dividing step, upper contact extraction step, an image binarization processing step, image statistics step, edge positioning scaling step, and image expansion step.
Patent

Relay measuring device and image processing method thereof

TL;DR: In this article, a relay measuring device and an image processing method for product detection is presented, which is high in product detection speed, large in processing information amount and high in detection accuracy.