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T. Kishii

Researcher at Toshiba

Publications -  5
Citations -  21

T. Kishii is an academic researcher from Toshiba. The author has contributed to research in topics: Birefringence & Refractive index. The author has an hindex of 3, co-authored 5 publications receiving 18 citations.

Papers
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Thermally tempered glass surface stress measurement by critical ray

TL;DR: In this paper, a critical ray was excited along the glass surface by laser beam incidence, and part of the critical ray were refracted during propagation, and the angle of refraction depended on the refractive index of the glass face.
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Laser biascope for surface stress measurement of tempered glasses

TL;DR: In this paper, it has been found that optical waveguide effects caused by the refractive index gradient affected the biascope pattern but, provided that stress birefringence was distinguished, by analyser rotation, from intrinsic refractive indices differences between guided modes, and that the bireringence and refraction index values were dissimilar, surface stress determination was possible.
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Optical waveguide effect of thermally tampered sheet and plate glasses—application to surface stress measurements

TL;DR: In this paper, the authors used two linearly polarized light beams which vibrate in directions vertical to and in parallel with the surfaces of a sheet and a plate glass to determine surface stress.
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Laser Sénarmont biascope for residual surface stress measurement of float glasses

TL;DR: In this paper, a gas laser-Senarmont compensator-biascope combination was used to detect surface stresses in float glasses using the optical waveguide effect in tin-diffused surface layers.
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Critical ray-like propagation modes along graded-index planar optical waveguides

TL;DR: In this paper, a planar optical waveguide and surface compression layers were formed simultaneously in the surface layer of glass plates by ion exchange, and a change in the refractometer patterns was observed.