T
T. Mochiyama
Publications - 1
Citations - 67
T. Mochiyama is an academic researcher. The author has contributed to research in topics: Fault coverage & Scan chain. The author has an hindex of 1, co-authored 1 publications receiving 66 citations.
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Proceedings ArticleDOI
BIST-aided scan test - a new method for test cost reduction
Takahisa Hiraide,Kwame Osei Boateng,Hideaki Konishi,K. Itaya,M. Emori,H. Yamanaka,T. Mochiyama +6 more
TL;DR: A new method that employs ATE and BIST structures to apply coded test patterns to LSI circuits to show drastic test cost reduction capability of the proposed method is proposed.