T
T. Nitta
Researcher at Mitsubishi Electric
Publications - Â 11
Citations - Â 443
T. Nitta is an academic researcher from Mitsubishi Electric. The author has contributed to research in topics: Electrical breakdown & Breakdown voltage. The author has an hindex of 9, co-authored 11 publications receiving 430 citations.
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Journal ArticleDOI
Factors Controlling Surface Flashover in SF6 Gas Insulated Systems
TL;DR: In this article, various factors controlling flashover of solid insulators in pressurized SF6, are reviewed and their influences in gas insulated systems are discussed from a practical point of view.
Journal ArticleDOI
Electrical Breakdown of Long Gaps in Sulfur Hexafluoride
T. Nitta,Y. Shibuya +1 more
TL;DR: In this article, the electrical discharge characteristics of SF6 are discussed theoretically in relation to the field dependence of the ionization coefficient a and the electron attachment coefficient, and a simple theoretical formulation of breakdown or corona inception voltages of gaps in SF6 is derived.
Journal ArticleDOI
Area Effect of Electrical Breakdown in Compressed SF6
T. Nitta,N. Yamada,Y. Fujiwara +2 more
TL;DR: In this article, the statistical properties of ac and dc breakdown field strength of compressed SF6 were investigated on four gaps of different electrode area, ranging from 0.2 cm2 to 3000 cm2, and the breakdown characteristics were classified into four categories depending on the type of distribution and the characteristics of conditioning effect.
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Static Electrification by Forced Oil Flow in Large Power Transformer
TL;DR: In this article, the static charge separation by the flow of oil can possibly exceed the dielectric strength of oil to produce a discharge in oil, and the important factors in the streaming electrification and the precautions for static charge problem are discussed.
Journal ArticleDOI
Stability and Long Term Degradation of Metal Oxide Surge Arresters
TL;DR: In this paper, the life of a metal oxide surge arrester is evaluated combining the degradation process with the above thermal runaway condition, and the Arrhenius relation is discussed in the light of the analysis.