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Takao Kuroda

Researcher at Panasonic

Publications -  43
Citations -  346

Takao Kuroda is an academic researcher from Panasonic. The author has contributed to research in topics: Signal & Voltage. The author has an hindex of 10, co-authored 43 publications receiving 346 citations. Previous affiliations of Takao Kuroda include Denso.

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Patent

Physical quantity distribution sensor, method of driving said sensor and method of producing said sensor

TL;DR: In this paper, a physical quantity distribution sensor is disclosed, which consists of a plurality of sensor/storage sections each having a sensor element for sensing a received physical quantity and a storage element for storing the information of physical quantity sensed by the sensor element; a selector for selecting at least one of the sensor or storage sections; and a pluralityof buffers each capable of detecting and supplying the information stored in at least a selected sensor/ storage section.
Patent

Physical quantity distribution sensor and method for driving the same

TL;DR: In this article, the authors proposed a physical quantity distribution sensor comprising a plurality of unit cells, each of which includes an information storage region responsive to a physical stimulus and capable of a transition from a first electrical potential state to a second electrical potential states according to the physical stimulus.
Patent

Setting file transmission system and transmitting method for setting file

TL;DR: In this paper, the authors propose a solution to allow a user who uses a terminal to easily set a setting file needed to connect the terminal to the Internet through an access point.
Patent

Solid state image sensor exhibiting reduced image smearing effects

TL;DR: In this article, a solid state image pickup device with a plurality of photoelectric transducers and a vertical transfer CCD (charge coupled device) unit was proposed. But the authors did not consider the effect of the impurity of a semiconductor substrate region surrounding each of the vertical transfer transducers.
Patent

Method for estimating yield of integrated circuit device

TL;DR: In this paper, the authors used the Stapper's equation showing the dependence of the yield on the defect density D and chip area A to calculate the expected yield Y, and the values of the correction factor K and the chip areas A are substituted into Y=f(A×K) to calculate expected yield X.