T
Takao Kuroda
Researcher at Panasonic
Publications - 43
Citations - 346
Takao Kuroda is an academic researcher from Panasonic. The author has contributed to research in topics: Signal & Voltage. The author has an hindex of 10, co-authored 43 publications receiving 346 citations. Previous affiliations of Takao Kuroda include Denso.
Papers
More filters
Patent
Physical quantity distribution sensor, method of driving said sensor and method of producing said sensor
Takao Kuroda,Masayuki Masuyama +1 more
TL;DR: In this paper, a physical quantity distribution sensor is disclosed, which consists of a plurality of sensor/storage sections each having a sensor element for sensing a received physical quantity and a storage element for storing the information of physical quantity sensed by the sensor element; a selector for selecting at least one of the sensor or storage sections; and a pluralityof buffers each capable of detecting and supplying the information stored in at least a selected sensor/ storage section.
Patent
Physical quantity distribution sensor and method for driving the same
Takao Kuroda,Masayuki Masuyama +1 more
TL;DR: In this article, the authors proposed a physical quantity distribution sensor comprising a plurality of unit cells, each of which includes an information storage region responsive to a physical stimulus and capable of a transition from a first electrical potential state to a second electrical potential states according to the physical stimulus.
Patent
Setting file transmission system and transmitting method for setting file
Takao Kuroda,黒田 隆雄 +1 more
TL;DR: In this paper, the authors propose a solution to allow a user who uses a terminal to easily set a setting file needed to connect the terminal to the Internet through an access point.
Patent
Solid state image sensor exhibiting reduced image smearing effects
TL;DR: In this article, a solid state image pickup device with a plurality of photoelectric transducers and a vertical transfer CCD (charge coupled device) unit was proposed. But the authors did not consider the effect of the impurity of a semiconductor substrate region surrounding each of the vertical transfer transducers.
Patent
Method for estimating yield of integrated circuit device
Hideki Ishida,Takao Kuroda +1 more
TL;DR: In this paper, the authors used the Stapper's equation showing the dependence of the yield on the defect density D and chip area A to calculate the expected yield Y, and the values of the correction factor K and the chip areas A are substituted into Y=f(A×K) to calculate expected yield X.