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Showing papers by "Takashi Tokuda published in 2001"


Proceedings ArticleDOI
TL;DR: In this article, a pixel circuit of a CMOS image sensor using PFM was designed for the next generation architecture of vision chips. And the photodiode is a parasitic pn diode between p-well and n-diffusion with the size of 2 micrometers squares.
Abstract: Inspired by biological information scheme, pulse frequency modulation (PFM) technique is robust for noise sources due to its digital encode of analog signals. In a viewpoint of image sensors, PFM is also useful for a wide dynamic range and has already been demonstrated over 60 dB. We have designed a pixel circuit of a CMOS image sensor using PFM for the next generation architecture of vision chips. The chip is fabricated using a standard 0.35 micrometers double poly, triple metal CMOS technology. The photodiode is a parasitic pn diode between p-well and n-diffusion with the size of 2 micrometers squares. The top of the photodiode is covered with third metal and 1 micrometers square hole is open for aperture. Feedback circuits consist of a Schmitt trigger and two inverters. We have demonstrated by introducing PFM the chip works well under the power supply voltage of 0.55V with 50 dB. Such a low voltage operation suggests deep sub-micron technologies, for example, 0.18 micrometers technologies could be applied to the sensor. The other important point in our chip is that the photodiode is very small in size of 2 micrometers by 2 micrometers with the aperture size of 1 micrometers by 1 micrometers . This enables us to realize an image sensor with a small fill factor, which is very useful for vision chips where functional circuits are integrated in each pixel.

1 citations


Proceedings ArticleDOI
15 Jul 2001
TL;DR: In this article, the polarization dependence of reflection-mode SNOM observation is characterized and an Al/glass grating with a fine structure is observed by SNOM images observed with parallel-and perpendicular-polarized light show different feature each other.
Abstract: The polarization dependence of reflection-mode SNOM observation is characterized An Al/glass grating with a fine structure is observed by SNOM SNOM images observed with parallel- and perpendicular-polarized light show different feature each other The difference is also studied by means of computer simulations