T
Takeshi Hirayama
Researcher at NEC
Publications - 4
Citations - 161
Takeshi Hirayama is an academic researcher from NEC. The author has contributed to research in topics: Transistor & Threshold voltage. The author has an hindex of 4, co-authored 4 publications receiving 161 citations.
Papers
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Patent
Semiconductor integrated circuit incorporated with substrate bias control circuit
Takeshi Hirayama,M. Fukuma +1 more
TL;DR: In this article, an internal circuit including a plurality of transistors formed on a P-type or an N-type substrate (or a well) which carries out a prescribed signal processing operation during the time of operation mode, a standby detection circuit, a bias potential generating circuit, and a switching circuit which supplies to the substrate (well) the potential of the source electrode and the bias potential in response to the active level and the inactive level, respectively, of the standby detection signal.
Patent
Semiconductor integrated circuit which prevents malfunctions caused by noise
TL;DR: In this article, a substrate bias is applied to the MOS transistor to forcibly have a reduced threshold, so that a malfunction can be prevented with the relatively high built-in threshold.
Book ChapterDOI
CGAA/EES at NEC Corporation, Powered by S-BPM: The Subject-Oriented BPM Development Technique Using Top-Down Approach
Shinji Nakamura,Toshihiro Tan,Takeshi Hirayama,Hiroyuki Kawai,Shota Komiyama,Sadao Hosaka,Minoru Nakamura,Katsuhiro Yuki +7 more
TL;DR: The "CGAA/EES development methodology" developed by NEC provides an overall optimization solution that overcomes issues by bringing a top-down approach to subject-oriented BPM.
Patent
Semiconductor integrated circuit device
TL;DR: In this paper, the authors proposed an approach to prevent a malfunction due to a noise generated in a GND line or a VDD line for a semiconductor integrated circuit device constituted of a MOS transistor which has been made minute and whose threshold value is low.