T
Tetsuro Aikawa
Researcher at Toshiba
Publications - 24
Citations - 103
Tetsuro Aikawa is an academic researcher from Toshiba. The author has contributed to research in topics: Signal & Laser. The author has an hindex of 5, co-authored 24 publications receiving 101 citations.
Papers
More filters
Patent
Instrument for examining/measuring object to be measured
Tetsuro Aikawa,Yoshinori Satoh,Tatsuya Oodake,Naruhiko Mukai,Hisashi Hozumi,Yasuhiro Yuguchi +5 more
TL;DR: An apparatus for inspecting and measuring an object to be measured includes: a distance measurement device having a light projector that projects a two-dimensional optical pattern onto a measurement target of the measurement object, imaging devices disposed in a stereoscopic arrangement that image the object, and a driving device that rotates a posture of at least one of the imaging devices to control a parallax angle between the two imaging devices as discussed by the authors.
Patent
Radiation measurement apparatus
TL;DR: In this article, a radiation measurement apparatus includes a radiation sensor that generates a detection signal, a first counter unit that counts the number of the detected signal, an oscillator that generates periodic signal with predetermined period, an AND circuit that outputs logical product obtained by performing AND operation between the detection signal and the periodic signal.
Patent
Apparatus for inspecting and measuring object to be measured
Tetsuro Aikawa,Yoshinori Satoh,Tatsuya Oodake,Naruhiko Mukai,Hisashi Hozumi,Yasuhiro Yuguchi +5 more
TL;DR: An apparatus for inspecting and measuring an object to be measured includes: a distance measurement device having a light projector that projects a two-dimensional optical pattern onto a measurement target of the measurement object, imaging devices disposed in a stereoscopic arrangement that image the object, and a driving device that rotates a posture of at least one of the imaging devices to control a parallax angle between the two imaging devices.
Patent
Visual examination device and visual examination method
Tetsuro Aikawa,Yoshinori Satoh,Makoto Ochiai,Tatsuya Oodake,Hiroyuki Adachi,Yasuhiro Yuguchi,Junichi Takabayashi +6 more
TL;DR: In this paper, a visual examination device comprises a camera for imaging an object to be examined, a movement estimating unit for estimating a movement of the camera or the object, a high-resolution image creating unit for creating a high resolution image with a resolution higher than the pixel resolution of the video from the camera from the video captured by the camera, an image evaluating unit for evaluating the quality of the created highresolution image.
Patent
Laser-based apparatus for ultrasonic flaw detection
Makoto Ochiai,Yoshiaki Ono,Takahiro Miura,Mitsuaki Shimamura,Masaki Yoda,Hidehiko Kuroda,Chida Itaru,Fukashi Osakata,Satoshi Yamamoto,Kentaro Tsuchihashi,Ryoichi Saeki,Masahiro Yoshida,Tetsuro Aikawa,Okada Satoshi,Toru Onodera,Akira Tsuyuki +15 more
TL;DR: In this article, a laser ultrasonic inspecting device comprises a surface-wave generating device (212) which irradiates laser light to a test object (211) so as to excite a surface wave (219), a surfacewave detecting device (213), and a flaw-detecting device (214) for detecting the flawed portion (223) based on the surface wave detection signal.