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Tsukasa Kiyoshi

Researcher at National Institute for Materials Science

Publications -  204
Citations -  3273

Tsukasa Kiyoshi is an academic researcher from National Institute for Materials Science. The author has contributed to research in topics: Superconducting magnet & Magnet. The author has an hindex of 29, co-authored 204 publications receiving 3014 citations. Previous affiliations of Tsukasa Kiyoshi include Kyushu University.

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Degradation of the performance of a YBCO-coated conductor double pancake coil due to epoxy impregnation

TL;DR: In this article, the critical current of an epoxy impregnated YBCO double pancake coil was substantially degraded, i.e., the normal voltage appears above 8 A, only 18% of that for the dry coil.
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Effect of YBCO-Coil Shape on the Screening Current-Induced Magnetic Field Intensity

TL;DR: In this article, a numerical simulation of the screening current-induced magnetic field for YBCO solenoids is presented. But the simulation is limited to the case of a single Y-coil.
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Reversible strain dependence of critical current in 100 a class coated conductors

TL;DR: In this article, the authors studied the strain dependence of the critical current for YBCO and DyBCO coated conductors with different buffer layers on Hastelloy substrates.
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Towards beyond 1 GHz NMR: Mechanism of the long-term drift of screening current-induced magnetic field in a Bi-2223 coil

TL;DR: The screening current-induced magnetic field in the (Bi,Pb) 2 Sr 2 Ca 2 Cu 3 O x (Bi-2223) insert coil proposed for a beyond 1 GHz NMR spectrometer may generate a long-term field drift, resulting in a loss of field-frequency lock operation and an inability to make high resolution NMR measurements.
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Effect of current sweep reversal on the magnetic field stability for a Bi-2223 superconducting solenoid

TL;DR: In this article, the effect of current sweep reversal on the temporal drift in magnetic field intensity for a Bi-2223 solenoid was investigated by experiment and using numerical simulation, and the current reversal formed a barrier for flux entrance at the upper and lower surface of the conductor, preventing flux creep.