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Showing papers by "V. Damodara Das published in 2003"

Journal Article•DOI•
Determination of the nature of principal scattering mechanism in well-annealed vacuum deposited thin films of the ternary thermoelectric material Bi2(Te0.8Se0.2)3

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V. Damodara Das1, Ramesh Chandra Mallik1•
Indian Institute of Technology Madras1
22 Jan 2003-Thin Solid Films
TL;DR: In this article, the Jain-Verma theory was applied to the experimental data of Bi2(Te 0.8Se 0.2)3 and the value of scattering index parameter was found to lie between −0.3 and −0.2.

4 citations

Growth of Thermoelectric Bia5Sb1~ Alloy Thin Films and their Characterization by XRD, TEM & RBS

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Ramesh Chandra Mallik, Satchidanand Rath, V. Damodara Das
01 Jan 2003
TL;DR: In this article, the authors used the integral method and the JainVerma theory to evaluate the power index in the energy dependent relaxation time, giving an idea about the nature of scattering in the thin film material.
Abstract: Bismuth and antimony are semimetals. The Bi,j.,,Sb, alloys (0.04