V
V. Lazauskas
Researcher at Vilnius University
Publications - 14
Citations - 279
V. Lazauskas is an academic researcher from Vilnius University. The author has contributed to research in topics: X-ray photoelectron spectroscopy & Electronic structure. The author has an hindex of 7, co-authored 14 publications receiving 256 citations.
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X-ray Photoelectron Spectra and Electronic Structure of Bi2S3 Crystals
TL;DR: In this paper, the X-ray photoelectron spectra (XPS) of the valence band and core levels of the semiconductive Bi 2 S 3 single crystal, which shows anomalies in various physical properties and weak phase transitions without change of symmetry, were measured with monochromatized Al K a radiation in the energy range 0-1400 eV and the temperature range 160-460 K.
Editor's Choice X-ray Photoelectron Spectra and Electronic Structure of Bi2S3 Crystals
TL;DR: In this article, the X-ray photoelectron spectra (XPS) of the valence band and core levels of the semiconductive Bi2S3 single crystal, which shows anomalies in various physical properties and weak phase transitions without change of symmetry, were measured with monochromatized Al Ka radiation in the energy range 0-1400 eV and the temperature range 160-460 K.
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X-ray Photoelectron Spectroscopy of Sb2S3 Crystals
TL;DR: In this article, the X-ray photoelectron spectra (XPS) of the valence band and core levels of semiconductor ferroelectric Sb2S3 single crystals were measured with monochromatized Al K α radiation in the energy range 0-1450 eV and the temperature range 160-450 K.
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Splitting of the XPS in Ferroelectric SbSI Crystals
TL;DR: In this paper, the X-ray photoelectron spectra (XPS) of the valence band and core levels of the ferroelectric SbSI single crystal were measured with monochromatized Al K f radiation in the energy range 0-1400 eV and the temperature range 130-330 K.
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XPS and electronic structure of quasi-one-dimensional BiSI crystals
TL;DR: In this paper, the X-ray photoelectron spectra (XPS) of the valence band (VB) and of the principal core levels (CL) from the (1/1/0) and (0/0/1) planes for the quasi-one-dimensional high dielectric permittivity BiSI single crystal were measured with monochromatized Al Kα radiation.