W
Wei Wang
Researcher at University of Electronic Science and Technology of China
Publications - 30
Citations - 323
Wei Wang is an academic researcher from University of Electronic Science and Technology of China. The author has contributed to research in topics: Machine tool & Numerical control. The author has an hindex of 8, co-authored 30 publications receiving 209 citations.
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A new test part to identify performance of five-axis machine tool—part I: geometrical and kinematic characteristics of S part
TL;DR: In this article, a new test part, S part, has been presented to satisfy the increasing demand of a five-axis machine, which presents more characteristics in three-dimensional surface contours.
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A novel approach for predicting tool remaining useful life using limited data
TL;DR: A novel method in which a deep bidirectional long short-term memory neural network in which sequential data are predicted and smoothed by forwards and backwards directions, respectively, is developed to encode temporal information and identify long-term dependencies is proposed.
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A new test part to identify performance of five-axis machine tool-Part II validation of S part
TL;DR: A new test part, the S part, has been further discussed on its validation, which presents more machine abilities than NAS979, which test well the performance of a five-axis machine center.
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Modeling and simulation of surface morphology abnormality of ‘S’ test piece machined by five-axis CNC machine tool
TL;DR: In this paper, a S-shape test part, called S-test piece, has been presented to demonstrate the machining precision of five-axis CNC machine tool, and the surface quality is evaluated by the peak-to-peak value (Vpp).
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Measurement method for volumetric error of five-axis machine tool considering measurement point distribution and adaptive identification process
TL;DR: A method for the geometric error identification of a five-axis machine tool that considers the optimised distribution of measurement points and accurate description of geometric errors to improve the identification accuracy.