W
Winston Lee
Researcher at SanDisk
Publications - 5
Citations - 1150
Winston Lee is an academic researcher from SanDisk. The author has contributed to research in topics: EEPROM & Reading (computer). The author has an hindex of 3, co-authored 5 publications receiving 1150 citations.
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Patent
Multi-state EEprom read and write circuits and techniques
TL;DR: In this article, the read, write and erase of EEprom memory enable nonvolatile multi-state memory to operate with enhanced performance over an extended period of time by using a set of reference cells which closely track and make adjustment for the variations presented by memory cells.
Patent
Latent defect handling in EEPROM devices
TL;DR: In this article, a memory system incorporating a word line current detector and an erase linecurrent detector in addition to the usual bit line current detectors is presented. But the leakage current of each of the lines are measured after predetermined memory events such as program or erase operations.
Proceedings ArticleDOI
Serial 9 Mb flash EEPROM for solid state disk applications
Sanjay Mehrotra,Jack H. Yuan,Raul Adrian Cernea,W.Y. Chien,Daniel C. Guterman,Gheorghe Samachisa,Robert D. Norman,Mehrdad Mofidi,Winston Lee,Yupin Kawing Fong,A. Mihnea,Eliyahou Harari,R.W. Gregor,E.P. Eberhardt,J.R. Radosevich,K.R. Stiles,R.A. Kohler,Chung Wai Leung,T.J. Mulrooney +18 more
TL;DR: A 9-Mb flash EEPROM incorporating a serial interface and other features specifically suited for low-cost, high-capacity, low-power solid-state storage systems has been fabricated using a triple polysilicon, single-metal, 0.9- mu m CMOS process.
Patent
EEPROM including reference cell
TL;DR: In this paper, the read, write and erase of EEprom memory is made relative to set of threshold levels as provided by a corresponding set of reference cells (431, 432 etc.) which closely track and make adjustment for the variations presented by memory cells.