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Multi-state EEprom read and write circuits and techniques

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TLDR
In this article, the read, write and erase of EEprom memory enable nonvolatile multi-state memory to operate with enhanced performance over an extended period of time by using a set of reference cells which closely track and make adjustment for the variations presented by memory cells.
Abstract
Improvements in the circuits and techniques for read, write and erase of EEprom memory enable nonvolatile multi-state memory to operate with enhanced performance over an extended period of time. In the improved circuits for normal read, and read between write or erase for verification, the reading is made relative to a set of threshold levels as provided by a corresponding set of reference cells which closely track and make adjustment for the variations presented by the memory cells. In one embodiment, each Flash sector of memory cells has its own reference cells for reading the cells in the sector, and a set of reference cells also exists for the whole memory chip acting as a master reference. In another embodiment, the reading is made relative to a set of threshold levels simultaneously by means of a one-to-many current mirror circuit. In improved write or erase circuits, verification of the written or erased data is done in parallel on a group of memory cells at a time and a circuit selectively inhibits further write or erase to those cells which have been correctly verified. Other improvements includes programming the ground state after erase, independent and variable power supply for the control gate of EEprom memory cells.

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Citations
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Patent

Semiconductor device, and manufacturing method thereof

TL;DR: In this article, the oxide semiconductor film has at least a crystallized region in a channel region, which is defined as a region of interest (ROI) for a semiconductor device.
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Flash EEprom system

TL;DR: In this paper, the authors proposed selective multiple sector erase, in which any combinations of Flash sectors may be erased together, and select sectors among the selected combination may also be de-selected during the erase operation.
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Two bit non-volatile electrically erasable and programmable semiconductor memory cell utilizing asymmetrical charge trapping

Boaz Eitan
TL;DR: In this paper, an electrically erasable programmable read-only memory (EEPROM) with a non-conducting charge trapping dielectric, such as silicon nitride, sandwiched between two silicon dioxide layers acting as electrical insulators is disclosed.
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Highly compact EPROM and flash EEPROM devices

TL;DR: In this article, an intelligent erase algorithm is used to prolong the useful life of the memory cells, which is useful as a solid state memory in place of magnetic disk storage devices in computer systems.
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TL;DR: In this article, the memory array is read with high fidelity, not to provide actual final digital data, but rather to provide raw data accurately reflecting the analog storage state, which information is sent to a memory controller for analysis and detection of the actual digital data.
References
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Patent

Highly scalable dynamic RAM cell with self-signal amplification

TL;DR: In this paper, a memory cell comprises a substrate of a first conductivity type (preferably N type) in which is formed a first region of opposite conductivities type.
Patent

Intelligent electrically programmable and electrically erasable ROM

TL;DR: In this article, an E2 PROM is disclosed which provides automatic programming verification, and the verification is conducted at potentials other than the normal reference potential to assure that the cells are well programmed with either binary zeroes or binary ones.
Journal ArticleDOI

A four-state EEPROM using floating-gate memory cells

TL;DR: In this paper, an electrically erasable programmable read-only memory (EEPROM) is used in a novel way as a four-state memory by charging the floating gate to determined values.
Patent

Word-by-word electrically reprogrammable nonvolatile memory

TL;DR: In this paper, the termination of the variable durations is indicated by attainment of a predetermined erase or, respectively, write condition of one or more memory cells from the memory line to be erased or written.
Patent

Electrically programmable semiconductor memory showing redundance

TL;DR: In this paper, the memory cells of the EEPROM with respect to variations of the threshold values are checked at defined intervals and by employing a classifying circuit integrated in an EE PROM.