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X. W. Tian
Researcher at University of Hong Kong
Publications - 2
Citations - 9
X. W. Tian is an academic researcher from University of Hong Kong. The author has contributed to research in topics: Iterative method & Projection (set theory). The author has an hindex of 2, co-authored 2 publications receiving 9 citations.
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Proceedings ArticleDOI
Textile fabric flaw detection using singular value decomposition
K.L. Mak,X. W. Tian +1 more
TL;DR: In this paper, a textile fabric defect detection method based on the technique of matrix singular value decomposition (SVD) is proposed, which extracts orthonormal eigenvectors from training defect-free images of a fabric.
Proceedings ArticleDOI
Iterative tensor tracking using GPU for textile fabric defect detection
K.L. Mak,X. W. Tian +1 more
TL;DR: The results demonstrate that the computation speed of the former is on average thirty times and ten times faster than that of the later for updating the S-HOG and for detecting defects respectively because of its parallel processing nature.