Showing papers by "Xiang Peng published in 1992"

TL;DR: In this paper, a new contouring method by dual-beam electronic speckle pattern interferometry is proposed, instead of tilting test objoct as used in previous single: wavelength techniques by ESPI, a tilt 10 be illuminating beams in order to obtain the conlour fringe patterns.

TL;DR: In this article, a simplified multi-wavelength ESPI contouring technique using a diode laser source has been demonstrated to be a useful tool in the shape measurement of an object.

TL;DR: In this article, an intrinsic decorrelation effect in a dual-beam ESPI system for contouring application is quantified by simple image processing techniques incorporating experimental data of speckle patterns.

TL;DR: In this paper, a new contouring technique using two-wavelength electronic speckle pattern interferometry (TWESPI) employing dual-beam illuminations is proposed, which allows the measurment of profiles of the steeper surfaces than has preciously been possible with a singlewavelength.

TL;DR: In this paper, a new Konturing-Methode with einer elektronischen Zweiwellenlangen-Speckle-Interferometrie (TWESPI) vorgeschlagen, bei der zwei Beleuchtungsstrahlen verwendet werden.