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Yajun Deng

Researcher at Peking University

Publications -  16
Citations -  159

Yajun Deng is an academic researcher from Peking University. The author has contributed to research in topics: Contact angle & Wetting. The author has an hindex of 4, co-authored 12 publications receiving 95 citations. Previous affiliations of Yajun Deng include City University of Hong Kong.

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Direct measurement of the contact angle of water droplet on quartz in a reservoir rock with atomic force microscopy

TL;DR: In this article, the contact angles of micro-sized water droplets on relatively rough quartz surfaces in a natural sand rock were measured with an atomic force microscopy (AFM) to understand the wettability of water on rough natural mineral surfaces, the results obtained show that the droplets were asymmetrical so that the contact angle which were around 27.8-50.3°, were different along the triple-phase contact lines, probably due to surface roughness, heterogeneity, atomic arrangement, etc.
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Nanoscale View of Dewetting and Coating on Partially Wetted Solids

TL;DR: This experimental study for the first time obtained the liquid morphology within 10 nm of the contact line, which was receding at low speed (U < 50 nm/s), putting an end to long-standing debate about the microscopic contact angle.
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Nanoscopic morphology of equilibrium thin water film near the contact line

TL;DR: In this article, the authors obtained the water film profile down to about 1nm from the contact line, through a state-of-the-art tapping-mode atomic force microscopy (TM-AFM).
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Effect of Micro- and Nanobubbles on the Crystallizationof THF Hydrate Based on theObservation by Atomic Force Microscopy

TL;DR: In this article, the air micro- and nanobubbles on a silicon wafer surface, generated by ethanol-water exchange method in THF solution, are found with anomalous small contact angles on the gas side due to the pinni...
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Study of THF Hydrate Crystallization Based on In Situ Observation with Atomic Force Microscopy

TL;DR: In this paper, the crystallization process of tetrahydrofuran (THF) solution on a silicon wafer is studied based on the in situ observation with a high-resolution atomic force microscope.