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Yamane Yoshio

Researcher at Mitsubishi

Publications -  10
Citations -  219

Yamane Yoshio is an academic researcher from Mitsubishi. The author has contributed to research in topics: Particle & Electron gun. The author has an hindex of 4, co-authored 10 publications receiving 219 citations.

Papers
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Patent

Image display apparatus

TL;DR: In this article, an image display with a string-like hot cathode for emitting electrons and perforated cover electrode for leading out and accelerating the electrons emitted from the cathode is presented.
Patent

Method and apparatus for detecting and regulating position of welding electron beam

TL;DR: In this paper, a method and apparatus for detecting and regulating a focused condition of an electron beam emitted from an electron gun of a electron beam welding apparatus is presented, where the electron beam of a low intensity is first directed onto the workpiece and the coil current of an electromagnetic condenser lens is then varied linearly.
Patent

Charged-particle distribution measuring apparatus

TL;DR: In this article, a particle passing member has a plurality of through-holes through which portions of a beam of charged particles can pass, a particle trapping member for trapping charged particles that have passed through the throughholes, a recoil particle-trapping member disposed between the particle passing and the particle trapping members, and a mechanism for moving the members to measure the spatial distribution of the charged particle beam.
Patent

Method of inspection for cathode-ray tube component members and apparatus used for embodying the same

TL;DR: In this paper, an inspection method and an inspection apparatus for the component members of the cathode-ray tube are disclosed, and the conformance or rejection of the object of inspection is decided from the illuminated condition of the phosphor screen by irradiating electron beams thereon.
Patent

Method and device for piercing by energy beam

TL;DR: In this paper, an electron beam is focused by using a focusin lens in the vicinity of the surface of a sample and its energy beam is used to correct a misalignment of the working hole caused by a thermal expansion of a work generated due to piercing by a computer.