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Yi-Hua Li
Publications - 1
Citations - 27
Yi-Hua Li is an academic researcher. The author has contributed to research in topics: Fault coverage & Stuck-at fault. The author has an hindex of 1, co-authored 1 publications receiving 27 citations.
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Capture-Power-Safe Test Pattern Determination for At-Speed Scan-Based Testing
TL;DR: Experimental results on ISCAS'89 and ITC'99 benchmark circuits show that an average of 75% of faults originally detected only by power-risky patterns can be detected by refining power-safe patterns and that most of the remaining faults can be detect by the low-power test generation process.