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Yoshizo Okamoto

Researcher at Hitachi

Publications -  1
Citations -  29

Yoshizo Okamoto is an academic researcher from Hitachi. The author has contributed to research in topics: Leakage (electronics) & Thermography. The author has an hindex of 1, co-authored 1 publications receiving 23 citations.

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Diagnosis of the leakage point on a structure surface using infrared thermography in near ambient conditions

TL;DR: In this article, the authors used infrared thermography in near ambient conditions to check the leakage point and its applicability is estimated by visualizing the temperature field generated around the point, which is not usually consistent with the surrounding temperature.