Some examples include determining the condition of photovoltaic modules at one or more points in time, in particular using line-scanning luminescence imaging techniques. One or more photoluminescence and/or electroluminescence images of a module may be acquired and processed using one or more algorithms to provide module data, including the detection of defects that may cause or may have caused module failure. Additionally, some examples include determining the condition of photovoltaic modules, such as throughout the production, transport, installation and service life of the photovoltaic modules.

Determining the condition of photovoltaic modules

Photoluminescence (PL) is an optical emission induced by photon absorption in a material where electrons are excited from the ground state to excited states, then relax to the lowest excited states and recombine radiatively. The PL emission provides vital information on bandgap energy, material purity and crystal quality. In this project, a PL characterization system, also capable of electroluminescence (EL) measurements, was designed and assem- bled to measure optoelectronic device structures with the capabilities of recording PL or EL spectra as well as micrometer-resolved PL or EL maps on device structures or active components.In order to realize the system with the above functions, an optical setup and a monochro- mator were used to achieve micrometer-range resolution and reasonable signal-to-noise ra- tio. A hardware control platform needed to be designed and assembled to control the precise movement of the sample stage and monochromator as well as for acquiring the signal. A PC-based control software were developed for fully automatic measurements . Furthermore, adequate alignment and calibration methods had to be developed to tune the optical path, monochromator and control program.The setup employs the basic ideas of confocal microscopy, with the parallel laser input focused on the sample surface with a spot diameter of 0.78 μm. A Czerny Turner diffraction grating based monochromator is used to measure PL emissions. A 532 nm laser diode and an InGaAs or Si detector are applied in the system for spectral range of detection of at least 850- 1600 nm, i.e. covering the important data and tele communication bands. The project builds on a platform containing EasyDrivers, an Anduino Uno micro-controller and a Labview based operation software, together working with an amplifier circuit for stepper motors actuation and signal acquisition. Finally, different quantum well samples were measured, showing that the wavelength accuracy and resolution as well as the program flexibility meet the specifications of the setup.

Yuxuan Sun

Papers

Setup for Micro Photo- and Electro-Luminescence of Optoelectronic Device Structures