scispace - formally typeset
Z

Zhengqiang Pan

Researcher at National University of Defense Technology

Publications -  16
Citations -  550

Zhengqiang Pan is an academic researcher from National University of Defense Technology. The author has contributed to research in topics: Prognostics & Residual. The author has an hindex of 8, co-authored 15 publications receiving 471 citations.

Papers
More filters
Journal ArticleDOI

Reliability modeling of degradation of products with multiple performance characteristics based on gamma processes

TL;DR: This paper proposes to use a bivariate Birnbaum–Saunders distribution and its marginal distributions to approximate the reliability function of a product that has two dependent performance characteristics and that their degradation can be modeled by gamma processes.
Journal ArticleDOI

Bivariate degradation analysis of products based on Wiener processes and copulas

TL;DR: In this paper, the authors consider a product with two performance characteristics and the degradation paths of these performance characteristics can be governed by a Wiener process with a time-scale transformation, and the dependency of the performance characteristics is described by a copula function.
Journal ArticleDOI

Bivariate Constant-Stress Accelerated Degradation Model and Inference

TL;DR: The Bayesian Markov chain Monte Carlo (MCMC) method is developed here for this model for obtaining the maximum likelihood estimates (MLEs) efficiently and a simulated example is presented along with the associated computational results.
Journal ArticleDOI

Multiple-Steps Step-Stress Accelerated Degradation Modeling Based on Wiener and Gamma Processes

TL;DR: The Bayesian Markov chain Monte Carlo (MCMC) method is applied for multiple-steps step-stress accelerated degradation models based on Wiener and gamma processes to obtain the maximum likelihood estimates (MLEs) efficiently and some computational results obtained from the implementation are presented.
Journal ArticleDOI

Optimal Design for Step-Stress Accelerated Degradation Test with Multiple Performance Characteristics Based on Gamma Processes

TL;DR: Reliability model of the degradation products with two performance characteristics based on gamma processes are introduced, and the corresponding SSADT model is presented under the constraint of total experimental cost.